Coverart for item
The Resource 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : proceedings : 3-5 November, 2003, Boston, Massachusetts, sponsored by IEEE Computer Society Technology Technical Committee on Fault-Tolerant Computing (TCFTC) [and the] IEEE Computer Society Test Technology Technical Council (TTTC)

18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : proceedings : 3-5 November, 2003, Boston, Massachusetts, sponsored by IEEE Computer Society Technology Technical Committee on Fault-Tolerant Computing (TCFTC) [and the] IEEE Computer Society Test Technology Technical Council (TTTC)

Label
18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : proceedings : 3-5 November, 2003, Boston, Massachusetts
Title
18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
Title remainder
proceedings : 3-5 November, 2003, Boston, Massachusetts
Statement of responsibility
sponsored by IEEE Computer Society Technology Technical Committee on Fault-Tolerant Computing (TCFTC) [and the] IEEE Computer Society Test Technology Technical Council (TTTC)
Title variation
  • International Symposium on Defect and Fault Tolerance in VLSI Systems
  • Defect and fault tolerance in VLSI systems
  • DFT 2003
Creator
Contributor
Subject
Genre
Language
eng
Member of
Cataloging source
GAT
Illustrations
illustrations
Index
index present
Language note
English
LC call number
TK7874
LC item number
.I177 2003c Online only
Literary form
non fiction
http://bibfra.me/vocab/lite/meetingDate
2003
http://bibfra.me/vocab/lite/meetingName
IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorName
  • IEEE Computer Society
  • IEEE Computer Society
http://library.link/vocab/subjectName
  • Integrated circuits
  • Fault-tolerant computing
Label
18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : proceedings : 3-5 November, 2003, Boston, Massachusetts, sponsored by IEEE Computer Society Technology Technical Committee on Fault-Tolerant Computing (TCFTC) [and the] IEEE Computer Society Test Technology Technical Council (TTTC)
Instantiates
Publication
Note
"IEEE Computer Society Order Number PR02042"--Title page verso
Bibliography note
Includes bibliographical references and author index
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
mixed
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
IEEE56814433
Dimensions
unknown
Extent
1 online resource (xii, 607 pages)
Form of item
online
Isbn
9780769520421
Lccn
2003111750
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations
Sound
unknown sound
Specific material designation
remote
System control number
  • ocm56814433\
  • (OCoLC)56814433
Label
18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : proceedings : 3-5 November, 2003, Boston, Massachusetts, sponsored by IEEE Computer Society Technology Technical Committee on Fault-Tolerant Computing (TCFTC) [and the] IEEE Computer Society Test Technology Technical Council (TTTC)
Publication
Note
"IEEE Computer Society Order Number PR02042"--Title page verso
Bibliography note
Includes bibliographical references and author index
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
mixed
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
IEEE56814433
Dimensions
unknown
Extent
1 online resource (xii, 607 pages)
Form of item
online
Isbn
9780769520421
Lccn
2003111750
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations
Sound
unknown sound
Specific material designation
remote
System control number
  • ocm56814433\
  • (OCoLC)56814433

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