Coverart for item
The Resource 1997 2nd International Workshop on Statistical Metrology, June 8, 1997, Kyoto, sponsored by IEEE Electron Devices Society and in cooperation with Japan Society of Applied Physics [and others]

1997 2nd International Workshop on Statistical Metrology, June 8, 1997, Kyoto, sponsored by IEEE Electron Devices Society and in cooperation with Japan Society of Applied Physics [and others]

Label
1997 2nd International Workshop on Statistical Metrology, June 8, 1997, Kyoto
Title
1997 2nd International Workshop on Statistical Metrology, June 8, 1997, Kyoto
Statement of responsibility
sponsored by IEEE Electron Devices Society and in cooperation with Japan Society of Applied Physics [and others]
Title variation
Statistical Metrology, 1997 2nd International Workshop on
Creator
Contributor
Subject
Genre
Language
eng
Member of
Cataloging source
OCL
Dewey number
621.38152
Illustrations
illustrations
Index
no index present
Language note
English
LC call number
TK7871.85
LC item number
.I5844 1997
Literary form
non fiction
http://bibfra.me/vocab/lite/meetingDate
1997
http://bibfra.me/vocab/lite/meetingName
International Workshop on Statistical Metrology
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorName
IEEE Electron Devices Society
http://library.link/vocab/subjectName
  • Semiconductors
  • Semiconductors
  • Engineering & Applied Sciences
Label
1997 2nd International Workshop on Statistical Metrology, June 8, 1997, Kyoto, sponsored by IEEE Electron Devices Society and in cooperation with Japan Society of Applied Physics [and others]
Instantiates
Publication
Note
"IEEE cat. no. 97TH8246."
Bibliography note
Includes bibliographical references
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Contents
Session I. Statistical device characterization -- Session II. Variation statistics on circuit -- Session III. Process & equipment simulation/calibration -- Session IV. Defect inspection -- Session V. SPC & yield modeling
Control code
IEEE47885233
Dimensions
unknown
Extent
1 online resource (vi, 124 pages)
Form of item
online
Isbn
9780780337381
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations
Sound
unknown sound
Specific material designation
remote
System control number
  • ocm47885233\
  • (OCoLC)47885233
Label
1997 2nd International Workshop on Statistical Metrology, June 8, 1997, Kyoto, sponsored by IEEE Electron Devices Society and in cooperation with Japan Society of Applied Physics [and others]
Publication
Note
"IEEE cat. no. 97TH8246."
Bibliography note
Includes bibliographical references
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Contents
Session I. Statistical device characterization -- Session II. Variation statistics on circuit -- Session III. Process & equipment simulation/calibration -- Session IV. Defect inspection -- Session V. SPC & yield modeling
Control code
IEEE47885233
Dimensions
unknown
Extent
1 online resource (vi, 124 pages)
Form of item
online
Isbn
9780780337381
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations
Sound
unknown sound
Specific material designation
remote
System control number
  • ocm47885233\
  • (OCoLC)47885233

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