Coverart for item
The Resource 1999 4th International Workshop on Statistical Metrology, technical co-sponsored by IEEE Electron Devices Society ; co-sponsored by VLSI symposium, the Japan Society of Applied Physics, IEEE ED Tokyo Chapter ; in cooperation with the Institute of Electronics, Information and Communication Engineers

1999 4th International Workshop on Statistical Metrology, technical co-sponsored by IEEE Electron Devices Society ; co-sponsored by VLSI symposium, the Japan Society of Applied Physics, IEEE ED Tokyo Chapter ; in cooperation with the Institute of Electronics, Information and Communication Engineers

Label
1999 4th International Workshop on Statistical Metrology
Title
1999 4th International Workshop on Statistical Metrology
Statement of responsibility
technical co-sponsored by IEEE Electron Devices Society ; co-sponsored by VLSI symposium, the Japan Society of Applied Physics, IEEE ED Tokyo Chapter ; in cooperation with the Institute of Electronics, Information and Communication Engineers
Title variation
  • 4th International Workshop on Statistical Metrology
  • Statistical Metrology, 1999, IWSM, 1999 4th International Workshop on
Creator
Contributor
Subject
Genre
Language
eng
Member of
Cataloging source
OCL
Dewey number
621.381520287
Illustrations
illustrations
Index
no index present
Language note
English
LC call number
TK7871.85
LC item number
.I5844 1999
Literary form
non fiction
http://bibfra.me/vocab/lite/meetingDate
1999
http://bibfra.me/vocab/lite/meetingName
International Workshop on Statistical Metrology
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorName
IEEE Electron Devices Society
http://library.link/vocab/subjectName
  • Semiconductors
  • Semiconductors
  • Engineering & Applied Sciences
Label
1999 4th International Workshop on Statistical Metrology, technical co-sponsored by IEEE Electron Devices Society ; co-sponsored by VLSI symposium, the Japan Society of Applied Physics, IEEE ED Tokyo Chapter ; in cooperation with the Institute of Electronics, Information and Communication Engineers
Instantiates
Publication
Note
  • "IWSM."
  • "IEEE Cat. No. 99TH8391."
Bibliography note
Includes bibliographical references
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
IEEE47883315
Dimensions
unknown
Extent
1 online resource (vi, 65 pages)
Form of item
online
Isbn
9780780351554
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations
Sound
unknown sound
Specific material designation
remote
System control number
  • ocm47883315\
  • (OCoLC)47883315
Label
1999 4th International Workshop on Statistical Metrology, technical co-sponsored by IEEE Electron Devices Society ; co-sponsored by VLSI symposium, the Japan Society of Applied Physics, IEEE ED Tokyo Chapter ; in cooperation with the Institute of Electronics, Information and Communication Engineers
Publication
Note
  • "IWSM."
  • "IEEE Cat. No. 99TH8391."
Bibliography note
Includes bibliographical references
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
IEEE47883315
Dimensions
unknown
Extent
1 online resource (vi, 65 pages)
Form of item
online
Isbn
9780780351554
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations
Sound
unknown sound
Specific material designation
remote
System control number
  • ocm47883315\
  • (OCoLC)47883315

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