Coverart for item
The Resource 2000 IEEE International Workshop on Defect Based Testing : April 30, 2000, Montreal, Canada : proceedings, sponsored by IEEE Computer Society Test Technology Technical Committee ; edited by Yashwant K. Malaiya, Manoj Sachdev, Sankaran M. Menon

2000 IEEE International Workshop on Defect Based Testing : April 30, 2000, Montreal, Canada : proceedings, sponsored by IEEE Computer Society Test Technology Technical Committee ; edited by Yashwant K. Malaiya, Manoj Sachdev, Sankaran M. Menon

Label
2000 IEEE International Workshop on Defect Based Testing : April 30, 2000, Montreal, Canada : proceedings
Title
2000 IEEE International Workshop on Defect Based Testing
Title remainder
April 30, 2000, Montreal, Canada : proceedings
Statement of responsibility
sponsored by IEEE Computer Society Test Technology Technical Committee ; edited by Yashwant K. Malaiya, Manoj Sachdev, Sankaran M. Menon
Title variation
  • DBT 2000
  • Testing of sub-micron VLSI defects
  • Digest of paper, IEEE International Workshop on Defect Based Testing
  • Defect based testing
  • Defect Based Testing, 2000, proceedings, 2000 IEEE International Workshop on
Creator
Contributor
Subject
Genre
Language
eng
Member of
Cataloging source
OCL
Dewey number
621.3815
Illustrations
illustrations
Index
index present
Language note
English
LC call number
TK7871.99.M44
LC item number
I5 2000
Literary form
non fiction
http://bibfra.me/vocab/lite/meetingDate
2000
http://bibfra.me/vocab/lite/meetingName
IEEE International Workshop on Defect Based Testing
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorName
  • Malaiya, Yashwant K
  • Sachdev, Manoj
  • Menon, Sankaran M
  • IEEE Computer Society
http://library.link/vocab/subjectName
  • Integrated circuits
  • Iddq testing
  • Metal oxide semiconductors, Complementary
Label
2000 IEEE International Workshop on Defect Based Testing : April 30, 2000, Montreal, Canada : proceedings, sponsored by IEEE Computer Society Test Technology Technical Committee ; edited by Yashwant K. Malaiya, Manoj Sachdev, Sankaran M. Menon
Instantiates
Publication
Note
  • "The workshop has been renamed from 'Iddq Testing' to 'DBT'"--Page vii
  • "IEEE Computer Society order number PR00637"--Title page verso
  • "IEEE order plan catalog number PR00637"--Title page verso
Bibliography note
Includes bibliographical references and index
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Contents
Feasibility of current measurements in sub 0.25-micron VLSIs / A. Keshavarzi, S. Borkar, V. De -- A new scheme for effective I/sub DDQ/ testing in deep submicron / Y. Tsiatouhas ... et al. -- Requirements for practical I/sub DDQ/ testing of deep submicron circuits / D.M.H. Walker -- Defect-based testing for fabless companies / J. Khare, H.T. Heubeken -- Optimal clustering and statistical identification of defective ICs using I/sub DDQ/ testing / A. Rao, A.P. Jayasumana, Y.K. Malaiya -- Impact of technology scaling on bridging fault detections in sequential and combinational CMOS circuits / O. Semenov, M. Schdev -- I/sub DDQ/ profiles / Hugo Cheung, S.K. Gupta -- A practical implementation of BICS for safety-critical applications / P.A. Smith, D.V. Campbell -- Testing of deep-submicron battery-operated circuits using new fast currrent monitoring cheme / M. Margal, I. Pecuh -- IDDQ testable design of static CMOS PLAs / M. Hashizume ... et al. -- On-line testing and diagnosis scheme for intermediate voltage values affecting bus lines / C. Metra, M. Favalli, B. Ricco
Control code
IEEE47883187
Dimensions
unknown
Extent
1 online resource (ix, 82 pages)
Form of item
online
Isbn
9780769506371
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations
Sound
unknown sound
Specific material designation
remote
System control number
  • ocm47883187\
  • (OCoLC)47883187
Label
2000 IEEE International Workshop on Defect Based Testing : April 30, 2000, Montreal, Canada : proceedings, sponsored by IEEE Computer Society Test Technology Technical Committee ; edited by Yashwant K. Malaiya, Manoj Sachdev, Sankaran M. Menon
Publication
Note
  • "The workshop has been renamed from 'Iddq Testing' to 'DBT'"--Page vii
  • "IEEE Computer Society order number PR00637"--Title page verso
  • "IEEE order plan catalog number PR00637"--Title page verso
Bibliography note
Includes bibliographical references and index
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Contents
Feasibility of current measurements in sub 0.25-micron VLSIs / A. Keshavarzi, S. Borkar, V. De -- A new scheme for effective I/sub DDQ/ testing in deep submicron / Y. Tsiatouhas ... et al. -- Requirements for practical I/sub DDQ/ testing of deep submicron circuits / D.M.H. Walker -- Defect-based testing for fabless companies / J. Khare, H.T. Heubeken -- Optimal clustering and statistical identification of defective ICs using I/sub DDQ/ testing / A. Rao, A.P. Jayasumana, Y.K. Malaiya -- Impact of technology scaling on bridging fault detections in sequential and combinational CMOS circuits / O. Semenov, M. Schdev -- I/sub DDQ/ profiles / Hugo Cheung, S.K. Gupta -- A practical implementation of BICS for safety-critical applications / P.A. Smith, D.V. Campbell -- Testing of deep-submicron battery-operated circuits using new fast currrent monitoring cheme / M. Margal, I. Pecuh -- IDDQ testable design of static CMOS PLAs / M. Hashizume ... et al. -- On-line testing and diagnosis scheme for intermediate voltage values affecting bus lines / C. Metra, M. Favalli, B. Ricco
Control code
IEEE47883187
Dimensions
unknown
Extent
1 online resource (ix, 82 pages)
Form of item
online
Isbn
9780769506371
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations
Sound
unknown sound
Specific material designation
remote
System control number
  • ocm47883187\
  • (OCoLC)47883187

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