Coverart for item
The Resource 2007 IEEE International Conference on Microelectronic Test Structures : ICMTS : conference proceedings : March 19-22, Takeda Hall, the University of Tokyo, Japan, [sponsored by the IEEE Electron Devices Society]

2007 IEEE International Conference on Microelectronic Test Structures : ICMTS : conference proceedings : March 19-22, Takeda Hall, the University of Tokyo, Japan, [sponsored by the IEEE Electron Devices Society]

Label
2007 IEEE International Conference on Microelectronic Test Structures : ICMTS : conference proceedings : March 19-22, Takeda Hall, the University of Tokyo, Japan
Title
2007 IEEE International Conference on Microelectronic Test Structures
Title remainder
ICMTS : conference proceedings : March 19-22, Takeda Hall, the University of Tokyo, Japan
Statement of responsibility
[sponsored by the IEEE Electron Devices Society]
Creator
Contributor
Subject
Genre
Language
eng
Related
Member of
Cataloging source
HNK
Illustrations
illustrations
Index
index present
Language note
English
LC call number
TK7874
LC item number
.I3237 2007
Literary form
non fiction
http://bibfra.me/vocab/lite/meetingDate
2007
http://bibfra.me/vocab/lite/meetingName
IEEE International Conference on Microelectronic Test Structures
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorName
IEEE Electron Devices Society
http://library.link/vocab/subjectName
  • Integrated circuits
  • Semiconductors
  • Electronic apparatus and appliances
Label
2007 IEEE International Conference on Microelectronic Test Structures : ICMTS : conference proceedings : March 19-22, Takeda Hall, the University of Tokyo, Japan, [sponsored by the IEEE Electron Devices Society]
Instantiates
Publication
Note
  • Title from copyright page
  • "IEEE catalog number: 07CH37856."
  • " ... International Conference on Microelectronic Test Structures (ICMTS 2007) ... is the 20th anniversary of the ICMTS"--Page ii
Bibliography note
Includes bibliographical references and index
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
multicolored
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
IEEE163811099
Dimensions
unknown
Extent
1 online resource (xi, 275 pages)
Form of item
online
Isbn
9781424407811
Lccn
2006936504
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations (some color)
Sound
unknown sound
Specific material designation
remote
System control number
  • ocn163811099
  • (OCoLC)163811099
Label
2007 IEEE International Conference on Microelectronic Test Structures : ICMTS : conference proceedings : March 19-22, Takeda Hall, the University of Tokyo, Japan, [sponsored by the IEEE Electron Devices Society]
Publication
Note
  • Title from copyright page
  • "IEEE catalog number: 07CH37856."
  • " ... International Conference on Microelectronic Test Structures (ICMTS 2007) ... is the 20th anniversary of the ICMTS"--Page ii
Bibliography note
Includes bibliographical references and index
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
multicolored
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
IEEE163811099
Dimensions
unknown
Extent
1 online resource (xi, 275 pages)
Form of item
online
Isbn
9781424407811
Lccn
2006936504
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations (some color)
Sound
unknown sound
Specific material designation
remote
System control number
  • ocn163811099
  • (OCoLC)163811099

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