Coverart for item
The Resource 2010 International Conference on Microelectronic Test Structures : 23rd IEEE ICMTS Conference proceedings, March 22-25, Hiroshima International Conference Center, Japan, sponsored by Association for Promotion of Electrical, Electronic and Information Engineering, the IEEE Electron Devices Society ; in cooperation with the Institute of Electronics, Information and Communication Engineers, the Japan Society of Applied Physics, VLSI Design and Education Center, the University of Tokyo

2010 International Conference on Microelectronic Test Structures : 23rd IEEE ICMTS Conference proceedings, March 22-25, Hiroshima International Conference Center, Japan, sponsored by Association for Promotion of Electrical, Electronic and Information Engineering, the IEEE Electron Devices Society ; in cooperation with the Institute of Electronics, Information and Communication Engineers, the Japan Society of Applied Physics, VLSI Design and Education Center, the University of Tokyo

Label
2010 International Conference on Microelectronic Test Structures : 23rd IEEE ICMTS Conference proceedings, March 22-25, Hiroshima International Conference Center, Japan
Title
2010 International Conference on Microelectronic Test Structures
Title remainder
23rd IEEE ICMTS Conference proceedings, March 22-25, Hiroshima International Conference Center, Japan
Statement of responsibility
sponsored by Association for Promotion of Electrical, Electronic and Information Engineering, the IEEE Electron Devices Society ; in cooperation with the Institute of Electronics, Information and Communication Engineers, the Japan Society of Applied Physics, VLSI Design and Education Center, the University of Tokyo
Title variation
  • 23rd IEEE ICMTS Conference proceedings
  • ICMTS 2010
  • 2010 IEEE International Conference on Microelectronic Test Structures (ICMTS)
  • Microelectronic Test Structures (ICMTS), 2010 IEEE International Conference on
Creator
Contributor
Subject
Genre
Language
eng
Member of
Cataloging source
WAU
Illustrations
illustrations
Index
no index present
LC call number
TK7874
Literary form
non fiction
http://bibfra.me/vocab/lite/meetingDate
2010
http://bibfra.me/vocab/lite/meetingName
IEEE International Conference on Microelectronic Test Structures
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorName
  • IEEE Electron Devices Society
  • Denki Denshi Jōhō Gakujutsu Shinkō Zaidan
http://library.link/vocab/subjectName
  • Integrated circuits
  • Semiconductors
  • Electronic apparatus and appliances
Label
2010 International Conference on Microelectronic Test Structures : 23rd IEEE ICMTS Conference proceedings, March 22-25, Hiroshima International Conference Center, Japan, sponsored by Association for Promotion of Electrical, Electronic and Information Engineering, the IEEE Electron Devices Society ; in cooperation with the Institute of Electronics, Information and Communication Engineers, the Japan Society of Applied Physics, VLSI Design and Education Center, the University of Tokyo
Instantiates
Publication
Bibliography note
Includes bibliographical references
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
IEEE678195511
Extent
1 online resource
Form of item
online
Isbn
9781424469147
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations
Specific material designation
remote
System control number
  • ocn678195511
  • (OCoLC)678195511
Label
2010 International Conference on Microelectronic Test Structures : 23rd IEEE ICMTS Conference proceedings, March 22-25, Hiroshima International Conference Center, Japan, sponsored by Association for Promotion of Electrical, Electronic and Information Engineering, the IEEE Electron Devices Society ; in cooperation with the Institute of Electronics, Information and Communication Engineers, the Japan Society of Applied Physics, VLSI Design and Education Center, the University of Tokyo
Publication
Bibliography note
Includes bibliographical references
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
IEEE678195511
Extent
1 online resource
Form of item
online
Isbn
9781424469147
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations
Specific material designation
remote
System control number
  • ocn678195511
  • (OCoLC)678195511

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