Coverart for item
The Resource 2011 IEEE International Conference on Microelectronic Test Structures : 24th ICMTS Conference proceedings, April 4-7, Amsterdam, NL, sponsored by the IEEE Electron Devices Society

2011 IEEE International Conference on Microelectronic Test Structures : 24th ICMTS Conference proceedings, April 4-7, Amsterdam, NL, sponsored by the IEEE Electron Devices Society

Label
2011 IEEE International Conference on Microelectronic Test Structures : 24th ICMTS Conference proceedings, April 4-7, Amsterdam, NL
Title
2011 IEEE International Conference on Microelectronic Test Structures
Title remainder
24th ICMTS Conference proceedings, April 4-7, Amsterdam, NL
Statement of responsibility
sponsored by the IEEE Electron Devices Society
Title variation
  • 24th ICMTS Conference proceedings
  • Microelectronic Test Structures (ICMTS), 2011 IEEE International Conference on
Creator
Contributor
Subject
Genre
Language
eng
Member of
Cataloging source
WAU
Illustrations
illustrations
Index
no index present
LC call number
TK7874
Literary form
non fiction
http://bibfra.me/vocab/lite/meetingDate
2011
http://bibfra.me/vocab/lite/meetingName
IEEE International Conference on Microelectronic Test Structures
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorName
IEEE Electron Devices Society
http://library.link/vocab/subjectName
  • Integrated circuits
  • Semiconductors
  • Electronic apparatus and appliances
Label
2011 IEEE International Conference on Microelectronic Test Structures : 24th ICMTS Conference proceedings, April 4-7, Amsterdam, NL, sponsored by the IEEE Electron Devices Society
Instantiates
Publication
Bibliography note
Includes bibliographical references
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
IEEE793803210
Extent
1 online resource
Form of item
online
Isbn
9781424485284
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations
Specific material designation
remote
System control number
  • ocn793803210
  • (OCoLC)793803210
Label
2011 IEEE International Conference on Microelectronic Test Structures : 24th ICMTS Conference proceedings, April 4-7, Amsterdam, NL, sponsored by the IEEE Electron Devices Society
Publication
Bibliography note
Includes bibliographical references
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
IEEE793803210
Extent
1 online resource
Form of item
online
Isbn
9781424485284
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations
Specific material designation
remote
System control number
  • ocn793803210
  • (OCoLC)793803210

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