Coverart for item
The Resource 2013 IEEE International Conference on Microelectronic Test Structures : conference proceedings : March 25-28, 2013, Nakanoshima Center, Osaka University, Osaka, Japan, sponsored by the IEEE Electron Devices Society, in cooperation with Institute of Electronics, Information and Communication Engineers (IEICE), Japan Society of Applied Physics (JSAP)

2013 IEEE International Conference on Microelectronic Test Structures : conference proceedings : March 25-28, 2013, Nakanoshima Center, Osaka University, Osaka, Japan, sponsored by the IEEE Electron Devices Society, in cooperation with Institute of Electronics, Information and Communication Engineers (IEICE), Japan Society of Applied Physics (JSAP)

Label
2013 IEEE International Conference on Microelectronic Test Structures : conference proceedings : March 25-28, 2013, Nakanoshima Center, Osaka University, Osaka, Japan
Title
2013 IEEE International Conference on Microelectronic Test Structures
Title remainder
conference proceedings : March 25-28, 2013, Nakanoshima Center, Osaka University, Osaka, Japan
Statement of responsibility
sponsored by the IEEE Electron Devices Society, in cooperation with Institute of Electronics, Information and Communication Engineers (IEICE), Japan Society of Applied Physics (JSAP)
Title variation
  • ICMTS 2013
  • Microelectronic Test Structures (ICMTS), 2013 IEEE International Conference on
Creator
Contributor
Sponsor
Subject
Genre
Language
eng
Member of
Cataloging source
COO
Illustrations
illustrations
Index
no index present
Literary form
non fiction
http://bibfra.me/vocab/lite/meetingDate
2013
http://bibfra.me/vocab/lite/meetingName
IEEE International Conference on Microelectronic Test Structures
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorName
  • IEEE Electron Devices Society
  • Denshi Jōhō Tsūshin Gakkai (Japan)
  • Ōyō Butsuri Gakkai
http://library.link/vocab/subjectName
  • Integrated circuits
  • Semiconductors
  • Electronic apparatus and appliances
Label
2013 IEEE International Conference on Microelectronic Test Structures : conference proceedings : March 25-28, 2013, Nakanoshima Center, Osaka University, Osaka, Japan, sponsored by the IEEE Electron Devices Society, in cooperation with Institute of Electronics, Information and Communication Engineers (IEICE), Japan Society of Applied Physics (JSAP)
Instantiates
Publication
Note
IEEE Cat. No. CFP13MTS-ART
Bibliography note
Includes bibliographical references
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
IEEE861074016
Dimensions
unknown
Extent
1 online resource
Form of item
online
Isbn
9781467348454
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations
Specific material designation
remote
System control number
  • ocn861074016
  • (OCoLC)861074016
Label
2013 IEEE International Conference on Microelectronic Test Structures : conference proceedings : March 25-28, 2013, Nakanoshima Center, Osaka University, Osaka, Japan, sponsored by the IEEE Electron Devices Society, in cooperation with Institute of Electronics, Information and Communication Engineers (IEICE), Japan Society of Applied Physics (JSAP)
Publication
Note
IEEE Cat. No. CFP13MTS-ART
Bibliography note
Includes bibliographical references
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
IEEE861074016
Dimensions
unknown
Extent
1 online resource
Form of item
online
Isbn
9781467348454
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations
Specific material designation
remote
System control number
  • ocn861074016
  • (OCoLC)861074016

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