Coverart for item
The Resource 2016 IEEE International Test Conference (ITC) : date, 15-17 Nov. 2016

2016 IEEE International Test Conference (ITC) : date, 15-17 Nov. 2016

Label
2016 IEEE International Test Conference (ITC) : date, 15-17 Nov. 2016
Title
2016 IEEE International Test Conference (ITC)
Title remainder
date, 15-17 Nov. 2016
Title variation
  • ITC 2016
  • Test Conference (ITC), 2016 IEEE International
  • Proceedings, 2016 IEEE International Test Conference (ITC)
Creator
Contributor
Sponsoring body
Subject
Genre
Language
eng
Member of
Cataloging source
COO
Illustrations
illustrations
Index
no index present
LC call number
TK7874
LC item number
.I593
Literary form
non fiction
http://bibfra.me/vocab/lite/meetingDate
2016
http://bibfra.me/vocab/lite/meetingName
International Test Conference
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorName
  • Institute of Electrical and Electronics Engineers
  • Institute of Electrical and Electronics Engineers
http://library.link/vocab/subjectName
  • Integrated circuits
  • Electronic digital computers
  • Computer software
  • Semiconductors
  • Radio frequency
  • Telecommunication
Label
2016 IEEE International Test Conference (ITC) : date, 15-17 Nov. 2016
Instantiates
Publication
Copyright
Note
  • "IEEE Catalog Number: CFP16ITC-ART"--PDF copyright page
  • "...welcome you to the 47th International Test Conference (ITC) sponsored by IEEE and IEEE Philadelphia Section. We are holding ITC in Fort Worth, Texas the week of November 14, 2016."--PDF Welcome message
Bibliography note
Includes bibliographical references
Carrier category
online resource
Carrier MARC source
rdacarrier
Content category
text
Content type MARC source
rdacontent
Control code
IEEE972609598
Dimensions
unknown
Extent
1 online resource
Form of item
online
Media category
computer
Media MARC source
rdamedia
Other physical details
illustrations
Specific material designation
remote
System control number
  • ocn972609598
  • (OCoLC)972609598
Label
2016 IEEE International Test Conference (ITC) : date, 15-17 Nov. 2016
Publication
Copyright
Note
  • "IEEE Catalog Number: CFP16ITC-ART"--PDF copyright page
  • "...welcome you to the 47th International Test Conference (ITC) sponsored by IEEE and IEEE Philadelphia Section. We are holding ITC in Fort Worth, Texas the week of November 14, 2016."--PDF Welcome message
Bibliography note
Includes bibliographical references
Carrier category
online resource
Carrier MARC source
rdacarrier
Content category
text
Content type MARC source
rdacontent
Control code
IEEE972609598
Dimensions
unknown
Extent
1 online resource
Form of item
online
Media category
computer
Media MARC source
rdamedia
Other physical details
illustrations
Specific material designation
remote
System control number
  • ocn972609598
  • (OCoLC)972609598

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