Coverart for item
The Resource 24th IEEE VLSI Test Symposium : proceedings : April 30-May 4, 2006, Berkeley, California, sponsored by IEEE Computer Society Test Technology Technical Council

24th IEEE VLSI Test Symposium : proceedings : April 30-May 4, 2006, Berkeley, California, sponsored by IEEE Computer Society Test Technology Technical Council

Label
24th IEEE VLSI Test Symposium : proceedings : April 30-May 4, 2006, Berkeley, California
Title
24th IEEE VLSI Test Symposium
Title remainder
proceedings : April 30-May 4, 2006, Berkeley, California
Statement of responsibility
sponsored by IEEE Computer Society Test Technology Technical Council
Title variation
  • Twenty fourth IEEE VLSI Test Symposium
  • VLSI Test Symposium
  • VTS 2006
  • VTS 06
Creator
Contributor
Subject
Genre
Language
eng
Summary
Annotation
Related
Member of
Cataloging source
AZU
Illustrations
illustrations
Index
index present
LC call number
TK7874
LC item number
.I3274 2006
Literary form
non fiction
http://bibfra.me/vocab/lite/meetingDate
2006
http://bibfra.me/vocab/lite/meetingName
IEEE VLSI Test Symposium
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorName
  • IEEE Computer Society
  • Institute of Electrical and Electronics Engineers
http://library.link/vocab/subjectName
Integrated circuits
Summary expansion
VTS 2006 focuses on innovation in the field of testing of integrated circuits and systems. VTS looks at the many trends and challenges in the semiconductor design and manufacturing industries with papers covering wide range of interests, including basic and continuing education for test professionals, the latest research developments, new directions and hot topics in test, and expert perspectives on current issues. The proceedings explores high speed interconnect testing, analog and mixed signal testing, delay testing, flash and memory testing, RF testing, yield analysis, nanoscale testing, IDDQ, MEMS, and wireless testing
Label
24th IEEE VLSI Test Symposium : proceedings : April 30-May 4, 2006, Berkeley, California, sponsored by IEEE Computer Society Test Technology Technical Council
Instantiates
Publication
Note
"IEEE Computer Society Order Number P2514"--Title page verso
Bibliography note
Includes bibliographical references and index
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
mixed
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
IEEE69157845
Dimensions
unknown
Extent
1 online resource (xxix, 428 pages)
Form of item
online
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations
Sound
unknown sound
Specific material designation
remote
System control number
  • ocm69157845\
  • (OCoLC)69157845
Label
24th IEEE VLSI Test Symposium : proceedings : April 30-May 4, 2006, Berkeley, California, sponsored by IEEE Computer Society Test Technology Technical Council
Publication
Note
"IEEE Computer Society Order Number P2514"--Title page verso
Bibliography note
Includes bibliographical references and index
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
mixed
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
IEEE69157845
Dimensions
unknown
Extent
1 online resource (xxix, 428 pages)
Form of item
online
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations
Sound
unknown sound
Specific material designation
remote
System control number
  • ocm69157845\
  • (OCoLC)69157845

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