Coverart for item
The Resource 25th IEEE VLSI Test Symposium : proceedings : 6-10 May, 2007, Berkeley, California, [sponsored by] IEEE Computer Society

25th IEEE VLSI Test Symposium : proceedings : 6-10 May, 2007, Berkeley, California, [sponsored by] IEEE Computer Society

Label
25th IEEE VLSI Test Symposium : proceedings : 6-10 May, 2007, Berkeley, California
Title
25th IEEE VLSI Test Symposium
Title remainder
proceedings : 6-10 May, 2007, Berkeley, California
Statement of responsibility
[sponsored by] IEEE Computer Society
Title variation
  • Twenty fifth IEEE VLSI Test Symposium
  • VTS 2007
  • VTS 07
  • VLSI Test Symposium, 2007, 25th IEEE
Creator
Contributor
Subject
Genre
Language
eng
Summary
Annotation
Member of
Cataloging source
AZU
Illustrations
illustrations
Index
index present
LC call number
TK7874
LC item number
.I255 2007
Literary form
non fiction
http://bibfra.me/vocab/lite/meetingDate
2007
http://bibfra.me/vocab/lite/meetingName
IEEE VLSI Test Symposium
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorName
  • IEEE Computer Society
  • Institute of Electrical and Electronics Engineers
http://library.link/vocab/subjectName
Integrated circuits
Summary expansion
VTS 2007 focuses on innovation in the field of testing of integrated circuits and systems. The core of VTS 2007 explores the many trends and challenges in the semiconductor design and manufacturing industries with papers covering a diverse and seminal set of topics including, RF and Analog Test, Delay Test, Memory Test, Diagnosis, Online Test, SOC Test, and Fault Prediction and Evaluation. The proceedings features special sessions and covers innovative practices highlighting cutting-edge challenges faced by test practitioners and innovative solutions.Contents: RF Test; Delay Test Quality; Memory Test; Test Compression; Going after Defects; Online Test; Diagnosis; ATPG for Delay Faults; Advances in Test; Failure Estimation; Fault Prediction & Evaluation; Analog Test; High Level Test Techniques; Memory Repair; SOC Test; Design for Test; Testing Large Chips; Ensuring Secure Chips
Label
25th IEEE VLSI Test Symposium : proceedings : 6-10 May, 2007, Berkeley, California, [sponsored by] IEEE Computer Society
Instantiates
Publication
Note
"IEEE Computer Society Order Number P2812"--Title page verso
Bibliography note
Includes bibliographical references and author index
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
mixed
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
IEEE143990162
Dimensions
unknown
Extent
1 online resource (xxx, 484 pages
Form of item
online
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations)
Sound
unknown sound
Specific material designation
remote
System control number
  • ocn143990162
  • (OCoLC)143990162
Label
25th IEEE VLSI Test Symposium : proceedings : 6-10 May, 2007, Berkeley, California, [sponsored by] IEEE Computer Society
Publication
Note
"IEEE Computer Society Order Number P2812"--Title page verso
Bibliography note
Includes bibliographical references and author index
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
mixed
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
IEEE143990162
Dimensions
unknown
Extent
1 online resource (xxx, 484 pages
Form of item
online
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations)
Sound
unknown sound
Specific material designation
remote
System control number
  • ocn143990162
  • (OCoLC)143990162

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