Coverart for item
The Resource 26th North Atlantic Test Workshop : May 8-10, 2017, Providence, Rhode Island, sponsored by the IEEE Providence Section

26th North Atlantic Test Workshop : May 8-10, 2017, Providence, Rhode Island, sponsored by the IEEE Providence Section

Label
26th North Atlantic Test Workshop : May 8-10, 2017, Providence, Rhode Island
Title
26th North Atlantic Test Workshop
Title remainder
May 8-10, 2017, Providence, Rhode Island
Statement of responsibility
sponsored by the IEEE Providence Section
Title variation
  • NATW 2017
  • 2017 IEEE North Atlantic Test Workshop (NATW)
Creator
Contributor
Issuing body
Sponsoring body
Subject
Genre
Language
eng
Summary
The IEEE North Atlantic Test Workshop provides a forum for discussions on the latest issues relating to high quality, economical, and efficient test methodologies and designs In addition to traditional topics, the 26th NATW will feature a general theme of Synthesis and Reliability Topics are not limited to, the following Analog, Mixed Signal and RF Testing Built In Self Test (BIST) Board Level Testing Delay and Performance Testing Design Verification Validation Diagnosis and Debug Fault Modeling Simulation FPGA and Embedded Core Testing IDDQ Testing DFM, Defect Analysis and Defect Based Testing Memory and MEMS Testing Nanotechnology Testing Online Testing System on Chip (SoC) Test and DebugTest Quality System Reliability
Member of
Cataloging source
COO
Illustrations
illustrations
Index
no index present
Intended audience
Scholarly & Professional
Intended audience source
IEEE
LC call number
TK7874
Literary form
non fiction
http://bibfra.me/vocab/lite/meetingDate
2017
http://bibfra.me/vocab/lite/meetingName
IEEE North Atlantic Test Workshop
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorName
  • Institute of Electrical and Electronics Engineers
  • Institute of Electrical and Electronics Engineers
http://library.link/vocab/subjectName
  • Integrated circuits
  • Random access memory
  • Systems on a chip
Label
26th North Atlantic Test Workshop : May 8-10, 2017, Providence, Rhode Island, sponsored by the IEEE Providence Section
Instantiates
Publication
Copyright
Bibliography note
Includes bibliographical references
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
multicolored
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
IEEE1012455863
Dimensions
unknown
Extent
1 online resource (various pagings)
Form of item
online
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations
Specific material designation
remote
System control number
  • on1012455863
  • (OCoLC)1012455863
Label
26th North Atlantic Test Workshop : May 8-10, 2017, Providence, Rhode Island, sponsored by the IEEE Providence Section
Publication
Copyright
Bibliography note
Includes bibliographical references
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
multicolored
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
IEEE1012455863
Dimensions
unknown
Extent
1 online resource (various pagings)
Form of item
online
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations
Specific material designation
remote
System control number
  • on1012455863
  • (OCoLC)1012455863

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