Coverart for item
The Resource Advanced characterization techniques for optics, semiconductors, and nanotechnologies III : 28-29 August 2007, San Diego, California, USA, Angela Duparre+ѓ, Bhanwar Singh, Zu-Han Gu, editors ; sponsored and published by SPIE, (electronic book)

Advanced characterization techniques for optics, semiconductors, and nanotechnologies III : 28-29 August 2007, San Diego, California, USA, Angela Duparre+ѓ, Bhanwar Singh, Zu-Han Gu, editors ; sponsored and published by SPIE, (electronic book)

Label
Advanced characterization techniques for optics, semiconductors, and nanotechnologies III : 28-29 August 2007, San Diego, California, USA
Title
Advanced characterization techniques for optics, semiconductors, and nanotechnologies III
Title remainder
28-29 August 2007, San Diego, California, USA
Statement of responsibility
Angela Duparre+ѓ, Bhanwar Singh, Zu-Han Gu, editors ; sponsored and published by SPIE
Contributor
Subject
Genre
Language
eng
Member of
Cataloging source
NJR
Illustrations
illustrations
Index
no index present
LC call number
TA1750
LC item number
.A37 2007
Literary form
non fiction
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorName
  • Duparré, Angela.
  • Singh, Bhanwar.
  • Gu, Zu-Han.
  • Society of Photo-optical Instrumentation Engineers
Series statement
Proceedings of SPIE,
Series volume
6672
http://library.link/vocab/subjectName
  • Optoelectronics
  • Optoelectronic devices
  • Optical measurements
  • Semiconductors
  • Thin films
  • Nanotechnology
Label
Advanced characterization techniques for optics, semiconductors, and nanotechnologies III : 28-29 August 2007, San Diego, California, USA, Angela Duparre+ѓ, Bhanwar Singh, Zu-Han Gu, editors ; sponsored and published by SPIE, (electronic book)
Instantiates
Publication
Note
Title from PDF title page (viewed on Oct. 3, 2007)
Bibliography note
Includes bibliographical references
Dimensions
unknown
Extent
1 v. (various pagings)
Form of item
electronic
Isbn
9780819468208
Issuing body
Issued as part of the SPIE Digital Library.
Other physical details
digital, PDF file.
Reproduction note
Electronic resource.
Sound
unknown sound
Specific material designation
remote
System details
Mode of access: World Wide Web
Label
Advanced characterization techniques for optics, semiconductors, and nanotechnologies III : 28-29 August 2007, San Diego, California, USA, Angela Duparre+ѓ, Bhanwar Singh, Zu-Han Gu, editors ; sponsored and published by SPIE, (electronic book)
Publication
Note
Title from PDF title page (viewed on Oct. 3, 2007)
Bibliography note
Includes bibliographical references
Dimensions
unknown
Extent
1 v. (various pagings)
Form of item
electronic
Isbn
9780819468208
Issuing body
Issued as part of the SPIE Digital Library.
Other physical details
digital, PDF file.
Reproduction note
Electronic resource.
Sound
unknown sound
Specific material designation
remote
System details
Mode of access: World Wide Web

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