Coverart for item
The Resource Advanced fabrication technologies for micro/nano optics and photonics II : 26-28 January 2009, San Jose, California, United States, Thomas J. Suleski, Winston V. Schoenfeld, Jian Jim Wang, editors ; sponsored by SPIE ; syposium cosponsors Texas Instruments Inc. (United States) [and others]

Advanced fabrication technologies for micro/nano optics and photonics II : 26-28 January 2009, San Jose, California, United States, Thomas J. Suleski, Winston V. Schoenfeld, Jian Jim Wang, editors ; sponsored by SPIE ; syposium cosponsors Texas Instruments Inc. (United States) [and others]

Label
Advanced fabrication technologies for micro/nano optics and photonics II : 26-28 January 2009, San Jose, California, United States
Title
Advanced fabrication technologies for micro/nano optics and photonics II
Title remainder
26-28 January 2009, San Jose, California, United States
Statement of responsibility
Thomas J. Suleski, Winston V. Schoenfeld, Jian Jim Wang, editors ; sponsored by SPIE ; syposium cosponsors Texas Instruments Inc. (United States) [and others]
Contributor
Subject
Genre
Language
eng
Member of
Additional physical form
Also available in print.
Cataloging source
NHM
http://bibfra.me/vocab/lite/collectionName
SPIE digital library
Dewey number
620/.5
Illustrations
illustrations
Index
no index present
LC call number
T174.7
LC item number
.A38 2009e
Literary form
non fiction
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorDate
  • 1969-
  • 1973-
http://library.link/vocab/relatedWorkOrContributorName
  • Suleski, Thomas J.
  • Schoenfeld, Winston V.
  • Wang, Jian J.
  • SPIE (Society)
Series statement
Proceedings of SPIE,
Series volume
v. 7205
http://library.link/vocab/subjectName
  • Nanotechnology
  • Optoelectronics
  • Photonics
  • Microelectromechanical systems
Label
Advanced fabrication technologies for micro/nano optics and photonics II : 26-28 January 2009, San Jose, California, United States, Thomas J. Suleski, Winston V. Schoenfeld, Jian Jim Wang, editors ; sponsored by SPIE ; syposium cosponsors Texas Instruments Inc. (United States) [and others]
Instantiates
Publication
Note
  • Title from title screen (viewed Mar. 30, 2009)
  • Access restricted to SPIE Digital Library subscribers
Antecedent source
unknown
Bibliography note
Includes bibliographical references
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
multicolored
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Dimensions
unknown
Extent
1 electronic text (PDF)
File format
unknown
Form of item
online
Isbn
9780819474513
Level of compression
unknown
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations (some color).
Quality assurance targets
unknown
Reformatting quality
unknown
Sound
unknown sound
Specific material designation
remote
System details
Mode of access: World Wide Web
Label
Advanced fabrication technologies for micro/nano optics and photonics II : 26-28 January 2009, San Jose, California, United States, Thomas J. Suleski, Winston V. Schoenfeld, Jian Jim Wang, editors ; sponsored by SPIE ; syposium cosponsors Texas Instruments Inc. (United States) [and others]
Publication
Note
  • Title from title screen (viewed Mar. 30, 2009)
  • Access restricted to SPIE Digital Library subscribers
Antecedent source
unknown
Bibliography note
Includes bibliographical references
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
multicolored
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Dimensions
unknown
Extent
1 electronic text (PDF)
File format
unknown
Form of item
online
Isbn
9780819474513
Level of compression
unknown
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations (some color).
Quality assurance targets
unknown
Reformatting quality
unknown
Sound
unknown sound
Specific material designation
remote
System details
Mode of access: World Wide Web

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