The Resource Atomic force microscopy : exploring basic modes and advanced applications, Greg Haugstad, (electronic book)

Atomic force microscopy : exploring basic modes and advanced applications, Greg Haugstad, (electronic book)

Label
Atomic force microscopy : exploring basic modes and advanced applications
Title
Atomic force microscopy
Title remainder
exploring basic modes and advanced applications
Statement of responsibility
Greg Haugstad
Creator
Subject
Language
eng
Summary
This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physical origin of artifacts, and signal/noise limitations. Coverage spans imaging, materials property characterization, in-liquid interfacial analysis, tribology, and electromagnetic interactions. "Supplementary material for this book can be found by entering ISBN 9780470638828 on booksuppo
Member of
Cataloging source
CaPaEBR
http://library.link/vocab/creatorDate
1963-
http://library.link/vocab/creatorName
Haugstad, Greg
Dewey number
620/.5
Illustrations
illustrations
Index
index present
LC call number
QH212.A78
LC item number
H38 2012eb
Literary form
non fiction
Nature of contents
  • standards specifications
  • bibliography
http://library.link/vocab/subjectName
  • Atomic force microscopy
  • Scanning proble microscopy
Label
Atomic force microscopy : exploring basic modes and advanced applications, Greg Haugstad, (electronic book)
Instantiates
Publication
Bibliography note
Includes bibliographical references and index
Carrier category
online resource
Carrier category code
  • cr
Carrier MARC source
rdacarrier
Color
multicolored
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Control code
ebr10606048
Dimensions
unknown
Extent
xxii, 464 p.
Form of item
electronic
Media category
computer
Media MARC source
rdamedia
Media type code
  • c
Original version note
Original electronic resource
Other physical details
ill.
Reproduction note
Electronic resource.
Specific material designation
remote
Label
Atomic force microscopy : exploring basic modes and advanced applications, Greg Haugstad, (electronic book)
Publication
Bibliography note
Includes bibliographical references and index
Carrier category
online resource
Carrier category code
  • cr
Carrier MARC source
rdacarrier
Color
multicolored
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Control code
ebr10606048
Dimensions
unknown
Extent
xxii, 464 p.
Form of item
electronic
Media category
computer
Media MARC source
rdamedia
Media type code
  • c
Original version note
Original electronic resource
Other physical details
ill.
Reproduction note
Electronic resource.
Specific material designation
remote

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