Coverart for item
The Resource Atomic force microscopy in process engineering : introduction to AFM for improved processes and products, [edited by] W. Richard Bowen and Nidal Hilal, (electronic book)

Atomic force microscopy in process engineering : introduction to AFM for improved processes and products, [edited by] W. Richard Bowen and Nidal Hilal, (electronic book)

Label
Atomic force microscopy in process engineering : introduction to AFM for improved processes and products
Title
Atomic force microscopy in process engineering
Title remainder
introduction to AFM for improved processes and products
Statement of responsibility
[edited by] W. Richard Bowen and Nidal Hilal
Contributor
Subject
Language
eng
Summary
Atomic force microscopy (AFM) is a surface imaging technique that can be applied at sub-nanometre resolution in liquids and gases. The same instrumentation can also be used to quantify directly the forces of interfacial interaction in such environments and is therefore a critical tool for process engineers and scientists, where AFM investigations are leading directly to improved processes and products. This is the first book to bring together both the basic theory and proven process engineering practice of AFM, and to present them in a way that is accessible and valuable to practising engineers, those who are improving their AFM skills and knowledge, and researchers who are developing new products and solutions using AFM. The book takes a rigorous but practical approach to ensure that it is also directly applicable to practical process engineering problems. Fundamentals of the techniques are concisely described and specific benefits for process engineering clearly defined and illustrated. Coverage of applications of AFM to important areas of process engineering is comprehensive. Each of the chapter authors are recognized authorities on their subject
Member of
Cataloging source
KNOVL
Dewey number
660
Illustrations
illustrations
Index
index present
LC call number
QH212.A78
LC item number
A86 2009eb
Literary form
non fiction
NAL call number
QH212.A78
NAL item number
A86 2009
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorName
  • Bowen, W. Richard.
  • Hilal, Nidal.
Series statement
Butterworth-Heinemann/IChemE series
http://library.link/vocab/subjectName
  • Atomic force microscopy
  • Production engineering
Label
Atomic force microscopy in process engineering : introduction to AFM for improved processes and products, [edited by] W. Richard Bowen and Nidal Hilal, (electronic book)
Instantiates
Publication
Bibliography note
Includes bibliographical references and index
Carrier category
online resource
Carrier category code
  • cr
Carrier MARC source
rdacarrier
Color
multicolored
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Contents
BASIC PRINCIPLES OF ATOMIC FORCE MICROSCOPY / W Richard Bowen, Nidal Hilal and Daniel Johnson -- CHARACTERISATION OF MEMBRANE SURFACES / W Richard Bowen, Nidal Hilal and Teodora Doneva -- AFM AND DEVELOPMENT OF (BIO)FOULING RESISTANT MEMBRANES / W Richard Bowen, Nidal Hilal, Huabing Yin and Laila Al-Khatib -- APPLICATION OF ATOMIC FORCE MICROSCOPY TO PARTICLE-PARTICLE INTERACTIONS / Nidal Hilal, Yuncheng Liang and Daniel Johnson -- QUANTIFICATION OF PARTICLE-BUBBLE INTERACTIONS / Nidal Hilal and Daniel Johnson -- NANOSCALE ANALYSIS OF PHARMACEUTICALS BY SCANNING PROBE MICROSCOPY / Clive J Roberts -- THE APPLICATION OF AFM WITHIN BIOPROCESS ENGINEERING / Chris J Wright -- THE APPLICATION OF AFM TO THE DEVELOPMENT OF PROCESS PLANT MATERIALS / Chris J Wright -- ATOMIC FORCE MICROSCOPY AND POLYMERS ON SURFACES / Vasileios Koutsos -- AFM-BASED MICRO/NANO-RHEOMETRY / Matthew S Barrow and P Rhodri Williams -- CONCLUSIONS AND FUTURE OUTLOOK / W Richard Bowen and Nidal Hilal
Control code
SCIDI488709610
Dimensions
unknown
Edition
1st ed.
Extent
1 online resource (xvi, 283 p.)
Form of item
online
Isbn
9781856175173
Media category
computer
Media MARC source
rdamedia
Media type code
  • c
Other physical details
ill.
Specific material designation
remote
Label
Atomic force microscopy in process engineering : introduction to AFM for improved processes and products, [edited by] W. Richard Bowen and Nidal Hilal, (electronic book)
Publication
Bibliography note
Includes bibliographical references and index
Carrier category
online resource
Carrier category code
  • cr
Carrier MARC source
rdacarrier
Color
multicolored
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Contents
BASIC PRINCIPLES OF ATOMIC FORCE MICROSCOPY / W Richard Bowen, Nidal Hilal and Daniel Johnson -- CHARACTERISATION OF MEMBRANE SURFACES / W Richard Bowen, Nidal Hilal and Teodora Doneva -- AFM AND DEVELOPMENT OF (BIO)FOULING RESISTANT MEMBRANES / W Richard Bowen, Nidal Hilal, Huabing Yin and Laila Al-Khatib -- APPLICATION OF ATOMIC FORCE MICROSCOPY TO PARTICLE-PARTICLE INTERACTIONS / Nidal Hilal, Yuncheng Liang and Daniel Johnson -- QUANTIFICATION OF PARTICLE-BUBBLE INTERACTIONS / Nidal Hilal and Daniel Johnson -- NANOSCALE ANALYSIS OF PHARMACEUTICALS BY SCANNING PROBE MICROSCOPY / Clive J Roberts -- THE APPLICATION OF AFM WITHIN BIOPROCESS ENGINEERING / Chris J Wright -- THE APPLICATION OF AFM TO THE DEVELOPMENT OF PROCESS PLANT MATERIALS / Chris J Wright -- ATOMIC FORCE MICROSCOPY AND POLYMERS ON SURFACES / Vasileios Koutsos -- AFM-BASED MICRO/NANO-RHEOMETRY / Matthew S Barrow and P Rhodri Williams -- CONCLUSIONS AND FUTURE OUTLOOK / W Richard Bowen and Nidal Hilal
Control code
SCIDI488709610
Dimensions
unknown
Edition
1st ed.
Extent
1 online resource (xvi, 283 p.)
Form of item
online
Isbn
9781856175173
Media category
computer
Media MARC source
rdamedia
Media type code
  • c
Other physical details
ill.
Specific material designation
remote

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