The Resource Automatic inspection and novel instrumentation : 25-26 June 1997, Singapore, Anthony Tung-Shuen Ho, Sreenivas Rao, Lee Ming Cheng, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, SPIE Singapore Chapter, [and] Institute of Physics Singapore ; cosponsored by SPIE Japan Chapter ... [et al.] ; cooperating organizations, Nanyang Technological University (Singapore) ... [et al.], (electronic book)

Automatic inspection and novel instrumentation : 25-26 June 1997, Singapore, Anthony Tung-Shuen Ho, Sreenivas Rao, Lee Ming Cheng, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, SPIE Singapore Chapter, [and] Institute of Physics Singapore ; cosponsored by SPIE Japan Chapter ... [et al.] ; cooperating organizations, Nanyang Technological University (Singapore) ... [et al.], (electronic book)

Label
Automatic inspection and novel instrumentation : 25-26 June 1997, Singapore
Title
Automatic inspection and novel instrumentation
Title remainder
25-26 June 1997, Singapore
Statement of responsibility
Anthony Tung-Shuen Ho, Sreenivas Rao, Lee Ming Cheng, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, SPIE Singapore Chapter, [and] Institute of Physics Singapore ; cosponsored by SPIE Japan Chapter ... [et al.] ; cooperating organizations, Nanyang Technological University (Singapore) ... [et al.]
Contributor
Subject
Genre
Language
eng
Member of
Cataloging source
SPIED
Dewey number
670.42/5
Illustrations
illustrations
Index
index present
LC call number
TS156.2
LC item number
.A894 1997
Literary form
non fiction
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorName
  • Ho, Anthony Tung-Shuen
  • Rao, Sreenivas
  • Cheng, Lee Ming
  • Society of Photo-optical Instrumentation Engineers
  • Society of Photo-optical Instrumentation Engineers
  • Institute of Physics, Singapore.
  • SPIE Digital Library
Series statement
SPIE proceedings series,
Series volume
3185
http://library.link/vocab/subjectName
  • Engineering inspection
  • Quality control
  • Optical detectors
  • Imaging systems
Label
Automatic inspection and novel instrumentation : 25-26 June 1997, Singapore, Anthony Tung-Shuen Ho, Sreenivas Rao, Lee Ming Cheng, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, SPIE Singapore Chapter, [and] Institute of Physics Singapore ; cosponsored by SPIE Japan Chapter ... [et al.] ; cooperating organizations, Nanyang Technological University (Singapore) ... [et al.], (electronic book)
Instantiates
Publication
Bibliography note
Includes bibliographical references and index
Dimensions
28 cm.
Dimensions
unknown
Extent
vii, 170 p.
Form of item
electronic
Other physical details
ill.
Reproduction note
Electronic resource.
Specific material designation
remote
Label
Automatic inspection and novel instrumentation : 25-26 June 1997, Singapore, Anthony Tung-Shuen Ho, Sreenivas Rao, Lee Ming Cheng, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, SPIE Singapore Chapter, [and] Institute of Physics Singapore ; cosponsored by SPIE Japan Chapter ... [et al.] ; cooperating organizations, Nanyang Technological University (Singapore) ... [et al.], (electronic book)
Publication
Bibliography note
Includes bibliographical references and index
Dimensions
28 cm.
Dimensions
unknown
Extent
vii, 170 p.
Form of item
electronic
Other physical details
ill.
Reproduction note
Electronic resource.
Specific material designation
remote

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