Coverart for item
The Resource Colloquium on "Semiconductor processing - quality through measurement" : on Wednesday, 27 April 1994, organised by Professional Groups C11 (Instrumentation Systems and Components) and E3 (Microelectronics and Semiconductor Devices) in association with IEE Scotland

Colloquium on "Semiconductor processing - quality through measurement" : on Wednesday, 27 April 1994, organised by Professional Groups C11 (Instrumentation Systems and Components) and E3 (Microelectronics and Semiconductor Devices) in association with IEE Scotland

Label
Colloquium on "Semiconductor processing - quality through measurement" : on Wednesday, 27 April 1994
Title
Colloquium on "Semiconductor processing - quality through measurement"
Title remainder
on Wednesday, 27 April 1994
Statement of responsibility
organised by Professional Groups C11 (Instrumentation Systems and Components) and E3 (Microelectronics and Semiconductor Devices) in association with IEE Scotland
Title variation
  • Semiconductor processing - quality through measurement, IEE Colloquium on
  • IEE Colloquium on Semiconductor Processing - Quality through Measurement
Creator
Contributor
Subject
Genre
Language
eng
Member of
Cataloging source
BUF
Illustrations
illustrations
Index
no index present
LC call number
TK7
LC item number
.I4 1994 no. 088
Literary form
non fiction
http://bibfra.me/vocab/lite/meetingDate
1994
http://bibfra.me/vocab/lite/meetingName
Colloquium on "Semiconductor Processing - Quality Through Measurement"
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorName
  • Institution of Electrical Engineers
  • Institution of Electrical Engineers
  • Institution of Electrical Engineers
Series statement
IEE digest
Series volume
no. 1994/088
http://library.link/vocab/subjectName
  • Semiconductors
  • Manufacturing processes
Label
Colloquium on "Semiconductor processing - quality through measurement" : on Wednesday, 27 April 1994, organised by Professional Groups C11 (Instrumentation Systems and Components) and E3 (Microelectronics and Semiconductor Devices) in association with IEE Scotland
Instantiates
Publication
Note
At head of title: Computing and Control Division
Bibliography note
Includes bibliographical references
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
black and white
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
IEEE57487288
Dimensions
unknown
Extent
1 online resource (1 volume (various pagings))
Form of item
online
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations.
Specific material designation
remote
System control number
  • ocm57487288\
  • (OCoLC)57487288
Label
Colloquium on "Semiconductor processing - quality through measurement" : on Wednesday, 27 April 1994, organised by Professional Groups C11 (Instrumentation Systems and Components) and E3 (Microelectronics and Semiconductor Devices) in association with IEE Scotland
Publication
Note
At head of title: Computing and Control Division
Bibliography note
Includes bibliographical references
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
black and white
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
IEEE57487288
Dimensions
unknown
Extent
1 online resource (1 volume (various pagings))
Form of item
online
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations.
Specific material designation
remote
System control number
  • ocm57487288\
  • (OCoLC)57487288

Library Locations

Processing Feedback ...