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The Resource Compendium of surface and interface analysis, The Surface Science Society of Japan, editor

Compendium of surface and interface analysis, The Surface Science Society of Japan, editor

Label
Compendium of surface and interface analysis
Title
Compendium of surface and interface analysis
Statement of responsibility
The Surface Science Society of Japan, editor
Contributor
Editor
Subject
Language
eng
Summary
This book concisely illustrates the techniques of major surface analysis and their applications to a few key examples. Surfaces play crucial roles in various interfacial processes, and their electronic/geometric structures rule the physical/chemical properties. In the last several decades, various techniques for surface analysis have been developed in conjunction with advances in optics, electronics, and quantum beams. This book provides a useful resource for a wide range of scientists and engineers from students to professionals in understanding the main points of each technique, such as principles, capabilities and requirements, at a glance. It is a contemporary encyclopedia for selecting the appropriate method depending on the reader's purpose
Cataloging source
N$T
Dewey number
620.44
Index
no index present
LC call number
TA418.7
Literary form
non fiction
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorName
Surface Science Society of Japan
http://library.link/vocab/subjectName
  • Surfaces (Technology)
  • Surfaces (Physics)
  • Surface chemistry
  • Interfaces (Physical sciences)
Label
Compendium of surface and interface analysis, The Surface Science Society of Japan, editor
Instantiates
Publication
Copyright
Antecedent source
unknown
Bibliography note
Includes bibliographical references
Carrier category
online resource
Carrier category code
  • cr
Carrier MARC source
rdacarrier
Color
multicolored
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Contents
  • Intro; List of the Editorial Staff; Editor-in-Chief; Vice Editor-in-Chief; Associate Editors; Preface; Contents; 1 Acoustic Microscopy; 1.1 Principles; 1.1.1 Observation of Soft Biological Matters; 1.1.2 Observation of Solid Matters; 1.2 Features; 1.3 Applications; 1.3.1 Sound Speed Profile; 1.3.2 Acoustic Impedance Profiles; Appendix; Derivation of Eq. (1.1); Derivation of Eq. (1.2); Derivation of Eq. (1.3); References; 2 Action Spectroscopy with STM; 2.1 Principle; 2.2 Features; 2.3 Instrumentation; 2.4 Applications; 2.4.1 Fundamental Structure of an Isolated Water Dimer on Pt(111)
  • 2.4.2 Dissociation Pathways of a Single Dimethyl Disulfide on Cu(111)References; 3 Ambient Pressure X-Ray Photoelectron Spectroscopy; 3.1 Principle; 3.2 Features; 3.3 Instrumentation; 3.4 Applications; 3.4.1 Operando Observation of Chemical Reaction; References; 4 Angle-Resolved Ultraviolet Photoelectron Spectroscopy; 4.1 Principle; 4.2 Features; 4.3 Instrumentation; 4.4 Applications; 4.4.1 Band Dispersion and Fermi Surface of 1T-VSe2; References; 5 Atom Probe Field Ion Microscope; 5.1 Principle; 5.2 Features; 5.3 Instrumentation; 5.4 Applications; 5.4.1 FIM Observation of a W Tip
  • 5.4.2 AP Analysis: Alloy of Ptâ#x80;#x93;Ir5.4.3 AP Analysis: The Interface Between Al and GaAs; References; 6 Atomic Force Microscope; 6.1 Principle; 6.2 Features; 6.3 Instrumentation; 6.4 Applications; 6.4.1 Atomic Resolution Imaging of an Insulating Surface in Contact Mode; 6.4.2 Force Measurement of a Single-Molecule Junction; References; 7 Auger Electron Spectroscopy; 7.1 Principle; 7.2 Features; 7.3 Instrumentation; 7.4 Applications; References; 8 Cathodoluminescence; 8.1 Principle; 8.2 Features; 8.3 Instrumentation; 8.4 Applications; References; 9 Conductive Atomic Force Microscopy
  • 9.1 Principle9.2 Features; 9.3 Instrumentation; 9.4 Applications; 9.4.1 Observation of Carbon Resistor; 9.4.2 Observation of P3HT/PCBM Blended Film; Reference; 10 Differential Interference Contrast Microscopy/Phase-Contrast Microscopy; 10.1 Principle; 10.2 Features; 10.3 Instrumentation; 10.3.1 DIM; 10.3.2 PCM; 10.4 Applications; 10.4.1 Spiral Growth Steps on a Silicon Carbide (SiC) Crystal; 10.4.2 Single Molecular Step on Ice; References; 11 Dynamic Secondary Ion Mass Spectrometry; 11.1 Principles; 11.2 Features; 11.3 Instrumentation; 11.4 Applications; References
  • 12 Elastic Recoil Detection Analysis12.1 Principle; 12.2 Features; 12.3 Instrumentation; 12.3.1 ERDA with Stopper Foil; 12.3.2 â#x88;#x86;E-E Telescope ERDA; 12.3.3 TOF-E Telescope ERDA; 12.4 Applications; 12.4.1 Hydrogen and Deuteron (Heavy Hydrogen) Quantification on a-C:H Films; 12.4.2 â#x88;#x86;E-E Plot Taken on TaO2N Film; References; 13 Electrochemical Atomic Force Microscopy; 13.1 Principle; 13.2 Features; 13.3 Instrumentation; 13.4 Application; 13.4.1 EC-FM-AFM Utilizing Iodine-Modified Au(111) Surface [9]; References; 14 Electrochemical Infrared Spectroscopy; 14.1 Principle; 14.2 Features
Control code
SPR1023861598
Dimensions
unknown
Extent
1 online resource.
File format
unknown
Form of item
online
Isbn
9789811061554
Level of compression
unknown
Media category
computer
Media MARC source
rdamedia
Media type code
  • c
Quality assurance targets
not applicable
Reformatting quality
unknown
Sound
unknown sound
Specific material designation
remote
System control number
  • on1023861598
  • (OCoLC)1023861598
Label
Compendium of surface and interface analysis, The Surface Science Society of Japan, editor
Publication
Copyright
Antecedent source
unknown
Bibliography note
Includes bibliographical references
Carrier category
online resource
Carrier category code
  • cr
Carrier MARC source
rdacarrier
Color
multicolored
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Contents
  • Intro; List of the Editorial Staff; Editor-in-Chief; Vice Editor-in-Chief; Associate Editors; Preface; Contents; 1 Acoustic Microscopy; 1.1 Principles; 1.1.1 Observation of Soft Biological Matters; 1.1.2 Observation of Solid Matters; 1.2 Features; 1.3 Applications; 1.3.1 Sound Speed Profile; 1.3.2 Acoustic Impedance Profiles; Appendix; Derivation of Eq. (1.1); Derivation of Eq. (1.2); Derivation of Eq. (1.3); References; 2 Action Spectroscopy with STM; 2.1 Principle; 2.2 Features; 2.3 Instrumentation; 2.4 Applications; 2.4.1 Fundamental Structure of an Isolated Water Dimer on Pt(111)
  • 2.4.2 Dissociation Pathways of a Single Dimethyl Disulfide on Cu(111)References; 3 Ambient Pressure X-Ray Photoelectron Spectroscopy; 3.1 Principle; 3.2 Features; 3.3 Instrumentation; 3.4 Applications; 3.4.1 Operando Observation of Chemical Reaction; References; 4 Angle-Resolved Ultraviolet Photoelectron Spectroscopy; 4.1 Principle; 4.2 Features; 4.3 Instrumentation; 4.4 Applications; 4.4.1 Band Dispersion and Fermi Surface of 1T-VSe2; References; 5 Atom Probe Field Ion Microscope; 5.1 Principle; 5.2 Features; 5.3 Instrumentation; 5.4 Applications; 5.4.1 FIM Observation of a W Tip
  • 5.4.2 AP Analysis: Alloy of Ptâ#x80;#x93;Ir5.4.3 AP Analysis: The Interface Between Al and GaAs; References; 6 Atomic Force Microscope; 6.1 Principle; 6.2 Features; 6.3 Instrumentation; 6.4 Applications; 6.4.1 Atomic Resolution Imaging of an Insulating Surface in Contact Mode; 6.4.2 Force Measurement of a Single-Molecule Junction; References; 7 Auger Electron Spectroscopy; 7.1 Principle; 7.2 Features; 7.3 Instrumentation; 7.4 Applications; References; 8 Cathodoluminescence; 8.1 Principle; 8.2 Features; 8.3 Instrumentation; 8.4 Applications; References; 9 Conductive Atomic Force Microscopy
  • 9.1 Principle9.2 Features; 9.3 Instrumentation; 9.4 Applications; 9.4.1 Observation of Carbon Resistor; 9.4.2 Observation of P3HT/PCBM Blended Film; Reference; 10 Differential Interference Contrast Microscopy/Phase-Contrast Microscopy; 10.1 Principle; 10.2 Features; 10.3 Instrumentation; 10.3.1 DIM; 10.3.2 PCM; 10.4 Applications; 10.4.1 Spiral Growth Steps on a Silicon Carbide (SiC) Crystal; 10.4.2 Single Molecular Step on Ice; References; 11 Dynamic Secondary Ion Mass Spectrometry; 11.1 Principles; 11.2 Features; 11.3 Instrumentation; 11.4 Applications; References
  • 12 Elastic Recoil Detection Analysis12.1 Principle; 12.2 Features; 12.3 Instrumentation; 12.3.1 ERDA with Stopper Foil; 12.3.2 â#x88;#x86;E-E Telescope ERDA; 12.3.3 TOF-E Telescope ERDA; 12.4 Applications; 12.4.1 Hydrogen and Deuteron (Heavy Hydrogen) Quantification on a-C:H Films; 12.4.2 â#x88;#x86;E-E Plot Taken on TaO2N Film; References; 13 Electrochemical Atomic Force Microscopy; 13.1 Principle; 13.2 Features; 13.3 Instrumentation; 13.4 Application; 13.4.1 EC-FM-AFM Utilizing Iodine-Modified Au(111) Surface [9]; References; 14 Electrochemical Infrared Spectroscopy; 14.1 Principle; 14.2 Features
Control code
SPR1023861598
Dimensions
unknown
Extent
1 online resource.
File format
unknown
Form of item
online
Isbn
9789811061554
Level of compression
unknown
Media category
computer
Media MARC source
rdamedia
Media type code
  • c
Quality assurance targets
not applicable
Reformatting quality
unknown
Sound
unknown sound
Specific material designation
remote
System control number
  • on1023861598
  • (OCoLC)1023861598

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