Coverart for item
The Resource DBT 2004 : 2004 IEEE International Workshop on Current & Defect Based Testing : proceedings : April 25, 2004, Napa Valley Marriott, Napa Valley, CA, USA, edited by Sankaran Menon [and others] ; sponsored by IEEE Computer Society Test Technology Technical Committee

DBT 2004 : 2004 IEEE International Workshop on Current & Defect Based Testing : proceedings : April 25, 2004, Napa Valley Marriott, Napa Valley, CA, USA, edited by Sankaran Menon [and others] ; sponsored by IEEE Computer Society Test Technology Technical Committee

Label
DBT 2004 : 2004 IEEE International Workshop on Current & Defect Based Testing : proceedings : April 25, 2004, Napa Valley Marriott, Napa Valley, CA, USA
Title
DBT 2004
Title remainder
2004 IEEE International Workshop on Current & Defect Based Testing : proceedings : April 25, 2004, Napa Valley Marriott, Napa Valley, CA, USA
Statement of responsibility
edited by Sankaran Menon [and others] ; sponsored by IEEE Computer Society Test Technology Technical Committee
Title variation
  • VDSM chips and the need for defect based test
  • Current & defect based testing
Creator
Contributor
Subject
Genre
Language
eng
Related
Member of
Cataloging source
AZU
Dewey number
621.39/732
Illustrations
illustrations
Index
index present
Language note
English
LC call number
TK7874
LC item number
.I32385 2004c Online only
Literary form
non fiction
http://bibfra.me/vocab/lite/meetingDate
2004
http://bibfra.me/vocab/lite/meetingName
IEEE International Workshop on Defect Based Testing
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorDate
2004
http://library.link/vocab/relatedWorkOrContributorName
  • Menon, Sankaran M
  • IEEE Computer Society
  • IEEE VLSI Test Symposium
http://library.link/vocab/subjectName
  • Integrated circuits
  • Iddq testing
  • Metal oxide semiconductors, Complementary
Label
DBT 2004 : 2004 IEEE International Workshop on Current & Defect Based Testing : proceedings : April 25, 2004, Napa Valley Marriott, Napa Valley, CA, USA, edited by Sankaran Menon [and others] ; sponsored by IEEE Computer Society Test Technology Technical Committee
Instantiates
Publication
Note
  • 2000 workshop as: IEEE International Workshop on Defect Based Testing
  • " ... held in conjunctionwith the VLSI Test Symposium (VTS2004), in Napa, CA. The theme of this year's workshop "VDSM Chips and the Need for Defect Based Test ..."--Page v
  • "IEEE Catalog Number 04EX1004"--Cover
Bibliography note
Includes bibliographical references and author index
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
mixed
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
IEEE58799172
Dimensions
unknown
Extent
1 online resource (ix, 112, [1] pages)
Form of item
online
Isbn
9780780389502
Lccn
2005278015
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations
Sound
unknown sound
Specific material designation
remote
System control number
  • ocm58799172\
  • (OCoLC)58799172
Label
DBT 2004 : 2004 IEEE International Workshop on Current & Defect Based Testing : proceedings : April 25, 2004, Napa Valley Marriott, Napa Valley, CA, USA, edited by Sankaran Menon [and others] ; sponsored by IEEE Computer Society Test Technology Technical Committee
Publication
Note
  • 2000 workshop as: IEEE International Workshop on Defect Based Testing
  • " ... held in conjunctionwith the VLSI Test Symposium (VTS2004), in Napa, CA. The theme of this year's workshop "VDSM Chips and the Need for Defect Based Test ..."--Page v
  • "IEEE Catalog Number 04EX1004"--Cover
Bibliography note
Includes bibliographical references and author index
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
mixed
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
IEEE58799172
Dimensions
unknown
Extent
1 online resource (ix, 112, [1] pages)
Form of item
online
Isbn
9780780389502
Lccn
2005278015
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations
Sound
unknown sound
Specific material designation
remote
System control number
  • ocm58799172\
  • (OCoLC)58799172

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