Coverart for item
The Resource Dielectric breakdown in gigascale electronics : time dependent failure mechanisms, Juan Pablo Borja, Toh-Ming Lu, Joel Plawsky, (electronic book)

Dielectric breakdown in gigascale electronics : time dependent failure mechanisms, Juan Pablo Borja, Toh-Ming Lu, Joel Plawsky, (electronic book)

Label
Dielectric breakdown in gigascale electronics : time dependent failure mechanisms
Title
Dielectric breakdown in gigascale electronics
Title remainder
time dependent failure mechanisms
Statement of responsibility
Juan Pablo Borja, Toh-Ming Lu, Joel Plawsky
Creator
Contributor
Author
Subject
Language
eng
Summary
This book focuses on the experimental and theoretical aspects of the time-dependent breakdown of advanced dielectric films used in gigascale electronics. Coverage includes the most important failure mechanisms for thin low-k films, new and established experimental techniques, recent advances in the area of dielectric failure, and advanced simulations/models to resolve and predict dielectric breakdown, all of which are of considerable importance for engineers and scientists working on developing and integrating present and future chip architectures. The book is specifically designed to aid scientists in assessing the reliability and robustness of electronic systems employing low-k dielectric materials such as nano-porous films. Similarly, the models presented here will help to improve current methodologies for estimating the failure of gigascale electronics at device operating conditions from accelerated lab test conditions. Numerous graphs, tables, and illustrations are included to facilitate understanding of the topics. Readers will be able to understand dielectric breakdown in thin films along with the main failure modes and characterization techniques. In addition, they will gain expertise on conventional as well as new field acceleration test models for predicting long term dielectric degradation
Member of
Cataloging source
YDX
http://library.link/vocab/creatorName
Borja, Juan Pablo
Dewey number
621.381
Index
no index present
LC call number
TK7874
Literary form
non fiction
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorName
  • Lu, Toh-Ming
  • Plawsky, Joel
Series statement
SpringerBriefs in materials
http://library.link/vocab/subjectName
  • Microelectronics
  • Interfaces (Physical sciences)
Label
Dielectric breakdown in gigascale electronics : time dependent failure mechanisms, Juan Pablo Borja, Toh-Ming Lu, Joel Plawsky, (electronic book)
Instantiates
Publication
Bibliography note
Includes bibliographical references and index
Carrier category
online resource
Carrier category code
  • cr
Carrier MARC source
rdacarrier
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Control code
SPR958865088
Dimensions
unknown
Extent
1 online resource.
Form of item
online
Isbn
9783319432205
Media category
computer
Media MARC source
rdamedia
Media type code
  • c
Specific material designation
remote
Label
Dielectric breakdown in gigascale electronics : time dependent failure mechanisms, Juan Pablo Borja, Toh-Ming Lu, Joel Plawsky, (electronic book)
Publication
Bibliography note
Includes bibliographical references and index
Carrier category
online resource
Carrier category code
  • cr
Carrier MARC source
rdacarrier
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Control code
SPR958865088
Dimensions
unknown
Extent
1 online resource.
Form of item
online
Isbn
9783319432205
Media category
computer
Media MARC source
rdamedia
Media type code
  • c
Specific material designation
remote

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