Coverart for item
The Resource Digest of papers : 1991 IEEE VLSI Test Symposium : chip-to-system test concerns for the 90's : April 15-17, 1991, Bally's Park Place Casino Hotel, Atlantic City, New Jersey, USA, sponsored by the IEEE Computer Society, Test Technology Technical Committee and IEEE Philadelphia Section

Digest of papers : 1991 IEEE VLSI Test Symposium : chip-to-system test concerns for the 90's : April 15-17, 1991, Bally's Park Place Casino Hotel, Atlantic City, New Jersey, USA, sponsored by the IEEE Computer Society, Test Technology Technical Committee and IEEE Philadelphia Section

Label
Digest of papers : 1991 IEEE VLSI Test Symposium : chip-to-system test concerns for the 90's : April 15-17, 1991, Bally's Park Place Casino Hotel, Atlantic City, New Jersey, USA
Title
Digest of papers
Title remainder
1991 IEEE VLSI Test Symposium : chip-to-system test concerns for the 90's : April 15-17, 1991, Bally's Park Place Casino Hotel, Atlantic City, New Jersey, USA
Statement of responsibility
sponsored by the IEEE Computer Society, Test Technology Technical Committee and IEEE Philadelphia Section
Title variation
  • Chip-to-system test concerns for the 90's
  • VLSI Test Symposium, 1991, "Chip-to-system test concerns for the 90's", digest of papers
Creator
Contributor
Subject
Genre
Language
eng
Member of
Cataloging source
OCL
Dewey number
621.3950287
Illustrations
illustrations
Index
no index present
LC call number
TK7874
LC item number
.I3274 1991
Literary form
non fiction
http://bibfra.me/vocab/lite/meetingDate
1991
http://bibfra.me/vocab/lite/meetingName
IEEE VLSI Test Symposium
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorName
  • IEEE Computer Society
  • Institution of Electrical and Electronics Incorporated Engineers
http://library.link/vocab/subjectName
Integrated circuits
Label
Digest of papers : 1991 IEEE VLSI Test Symposium : chip-to-system test concerns for the 90's : April 15-17, 1991, Bally's Park Place Casino Hotel, Atlantic City, New Jersey, USA, sponsored by the IEEE Computer Society, Test Technology Technical Committee and IEEE Philadelphia Section
Instantiates
Publication
Note
"IEEE catalog number 91TH0353-3"--Title page verso
Bibliography note
Includes bibliographical references
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
IEEE47881726
Dimensions
unknown
Extent
1 online resource (vii, 308 pages)
Form of item
online
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations
Sound
unknown sound
Specific material designation
remote
System control number
  • ocm47881726\
  • (OCoLC)47881726
Label
Digest of papers : 1991 IEEE VLSI Test Symposium : chip-to-system test concerns for the 90's : April 15-17, 1991, Bally's Park Place Casino Hotel, Atlantic City, New Jersey, USA, sponsored by the IEEE Computer Society, Test Technology Technical Committee and IEEE Philadelphia Section
Publication
Note
"IEEE catalog number 91TH0353-3"--Title page verso
Bibliography note
Includes bibliographical references
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
IEEE47881726
Dimensions
unknown
Extent
1 online resource (vii, 308 pages)
Form of item
online
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations
Sound
unknown sound
Specific material designation
remote
System control number
  • ocm47881726\
  • (OCoLC)47881726

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