The Resource ESD : failure mechanisms and models, Steven H. Voldman, (electronic book)

ESD : failure mechanisms and models, Steven H. Voldman, (electronic book)

Label
ESD : failure mechanisms and models
Title
ESD
Title remainder
failure mechanisms and models
Statement of responsibility
Steven H. Voldman
Title variation
Electrostatic discharge
Creator
Subject
Language
eng
Summary
Electrostatic discharge (ESD) failure mechanisms continue to impact semiconductor components and systems as technologies scale from micro- to nano-electronics. This book studies electrical overstress, ESD, and latchup from a failure analysis and case-study approach. It provides a clear insight into the physics of failure from a generalist perspective, followed by investigation of failure mechanisms in specific technologies, circuits, and systems. The book is unique in covering both the failure mechanism and the practical solutions to fix the problem from either a technology or circuit method
Cataloging source
CaPaEBR
http://library.link/vocab/creatorName
Voldman, Steven H
Dewey number
621.381
Index
index present
LC call number
TK7871.852
LC item number
.V65 2009eb
Literary form
non fiction
Nature of contents
  • standards specifications
  • bibliography
http://library.link/vocab/subjectName
  • Semiconductors
  • Integrated circuits
  • Integrated circuits
  • Integrated circuits
  • Electric discharges
  • Electrostatics
Label
ESD : failure mechanisms and models, Steven H. Voldman, (electronic book)
Instantiates
Publication
Bibliography note
Includes bibliographical references and index
Carrier category
online resource
Carrier category code
  • cr
Carrier MARC source
rdacarrier
Color
multicolored
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Control code
ebr10317806
Dimensions
unknown
Extent
xxiv, 384 p.
Form of item
electronic
Media category
computer
Media MARC source
rdamedia
Media type code
  • c
Original version note
Original electronic resource
Reproduction note
Electronic resource.
Specific material designation
remote
Label
ESD : failure mechanisms and models, Steven H. Voldman, (electronic book)
Publication
Bibliography note
Includes bibliographical references and index
Carrier category
online resource
Carrier category code
  • cr
Carrier MARC source
rdacarrier
Color
multicolored
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Control code
ebr10317806
Dimensions
unknown
Extent
xxiv, 384 p.
Form of item
electronic
Media category
computer
Media MARC source
rdamedia
Media type code
  • c
Original version note
Original electronic resource
Reproduction note
Electronic resource.
Specific material designation
remote

Library Locations

Processing Feedback ...