The Resource ESD : failure mechanisms and models, Steven H. Voldman, (electronic book)
ESD : failure mechanisms and models, Steven H. Voldman, (electronic book)
Resource Information
The item ESD : failure mechanisms and models, Steven H. Voldman, (electronic book) represents a specific, individual, material embodiment of a distinct intellectual or artistic creation found in Sydney Jones Library, University of Liverpool.This item is available to borrow from 1 library branch.
Resource Information
The item ESD : failure mechanisms and models, Steven H. Voldman, (electronic book) represents a specific, individual, material embodiment of a distinct intellectual or artistic creation found in Sydney Jones Library, University of Liverpool.
This item is available to borrow from 1 library branch.
- Summary
- Electrostatic discharge (ESD) failure mechanisms continue to impact semiconductor components and systems as technologies scale from micro- to nano-electronics. This book studies electrical overstress, ESD, and latchup from a failure analysis and case-study approach. It provides a clear insight into the physics of failure from a generalist perspective, followed by investigation of failure mechanisms in specific technologies, circuits, and systems. The book is unique in covering both the failure mechanism and the practical solutions to fix the problem from either a technology or circuit method
- Language
- eng
- Extent
- xxiv, 384 p.
- Label
- ESD : failure mechanisms and models
- Title
- ESD
- Title remainder
- failure mechanisms and models
- Statement of responsibility
- Steven H. Voldman
- Title variation
- Electrostatic discharge
- Language
- eng
- Summary
- Electrostatic discharge (ESD) failure mechanisms continue to impact semiconductor components and systems as technologies scale from micro- to nano-electronics. This book studies electrical overstress, ESD, and latchup from a failure analysis and case-study approach. It provides a clear insight into the physics of failure from a generalist perspective, followed by investigation of failure mechanisms in specific technologies, circuits, and systems. The book is unique in covering both the failure mechanism and the practical solutions to fix the problem from either a technology or circuit method
- Cataloging source
- CaPaEBR
- http://library.link/vocab/creatorName
- Voldman, Steven H
- Dewey number
- 621.381
- Index
- index present
- LC call number
- TK7871.852
- LC item number
- .V65 2009eb
- Literary form
- non fiction
- Nature of contents
-
- standards specifications
- bibliography
- http://library.link/vocab/subjectName
-
- Semiconductors
- Integrated circuits
- Integrated circuits
- Integrated circuits
- Electric discharges
- Electrostatics
- Label
- ESD : failure mechanisms and models, Steven H. Voldman, (electronic book)
- Bibliography note
- Includes bibliographical references and index
- Carrier category
- online resource
- Carrier category code
-
- cr
- Carrier MARC source
- rdacarrier
- Color
- multicolored
- Content category
- text
- Content type code
-
- txt
- Content type MARC source
- rdacontent
- Control code
- ebr10317806
- Dimensions
- unknown
- Extent
- xxiv, 384 p.
- Form of item
- electronic
- Media category
- computer
- Media MARC source
- rdamedia
- Media type code
-
- c
- Original version note
- Original electronic resource
- Reproduction note
- Electronic resource.
- Specific material designation
- remote
- Label
- ESD : failure mechanisms and models, Steven H. Voldman, (electronic book)
- Bibliography note
- Includes bibliographical references and index
- Carrier category
- online resource
- Carrier category code
-
- cr
- Carrier MARC source
- rdacarrier
- Color
- multicolored
- Content category
- text
- Content type code
-
- txt
- Content type MARC source
- rdacontent
- Control code
- ebr10317806
- Dimensions
- unknown
- Extent
- xxiv, 384 p.
- Form of item
- electronic
- Media category
- computer
- Media MARC source
- rdamedia
- Media type code
-
- c
- Original version note
- Original electronic resource
- Reproduction note
- Electronic resource.
- Specific material designation
- remote
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<div class="citation" vocab="http://schema.org/"><i class="fa fa-external-link-square fa-fw"></i> Data from <span resource="http://link.liverpool.ac.uk/portal/ESD--failure-mechanisms-and-models-Steven-H./5J-DCY9Bbz4/" typeof="Book http://bibfra.me/vocab/lite/Item"><span property="name http://bibfra.me/vocab/lite/label"><a href="http://link.liverpool.ac.uk/portal/ESD--failure-mechanisms-and-models-Steven-H./5J-DCY9Bbz4/">ESD : failure mechanisms and models, Steven H. Voldman, (electronic book)</a></span> - <span property="potentialAction" typeOf="OrganizeAction"><span property="agent" typeof="LibrarySystem http://library.link/vocab/LibrarySystem" resource="http://link.liverpool.ac.uk/"><span property="name http://bibfra.me/vocab/lite/label"><a property="url" href="http://link.liverpool.ac.uk/">Sydney Jones Library, University of Liverpool</a></span></span></span></span></div>
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<div class="citation" vocab="http://schema.org/"><i class="fa fa-external-link-square fa-fw"></i> Data from <span resource="http://link.liverpool.ac.uk/portal/ESD--failure-mechanisms-and-models-Steven-H./5J-DCY9Bbz4/" typeof="Book http://bibfra.me/vocab/lite/Item"><span property="name http://bibfra.me/vocab/lite/label"><a href="http://link.liverpool.ac.uk/portal/ESD--failure-mechanisms-and-models-Steven-H./5J-DCY9Bbz4/">ESD : failure mechanisms and models, Steven H. Voldman, (electronic book)</a></span> - <span property="potentialAction" typeOf="OrganizeAction"><span property="agent" typeof="LibrarySystem http://library.link/vocab/LibrarySystem" resource="http://link.liverpool.ac.uk/"><span property="name http://bibfra.me/vocab/lite/label"><a property="url" href="http://link.liverpool.ac.uk/">Sydney Jones Library, University of Liverpool</a></span></span></span></span></div>
