The Resource Electromigration modeling at circuit layout level, her Ming Tan, Feifei He, (electronic book)
Electromigration modeling at circuit layout level, her Ming Tan, Feifei He, (electronic book)
Resource Information
The item Electromigration modeling at circuit layout level, her Ming Tan, Feifei He, (electronic book) represents a specific, individual, material embodiment of a distinct intellectual or artistic creation found in Sydney Jones Library, University of Liverpool.This item is available to borrow from 1 library branch.
Resource Information
The item Electromigration modeling at circuit layout level, her Ming Tan, Feifei He, (electronic book) represents a specific, individual, material embodiment of a distinct intellectual or artistic creation found in Sydney Jones Library, University of Liverpool.
This item is available to borrow from 1 library branch.
- Extent
- 1 online resource.
- Contents
-
- Introduction
- 3D Circuit Model Construction and Simulation
- Comparison of EM Performances in Circuit and Test Structures
- Interconnect EM Reliability Modeling at Circuit Layout Level
- Concluding Remarks
- Isbn
- 9789814451215
- Label
- Electromigration modeling at circuit layout level
- Title
- Electromigration modeling at circuit layout level
- Statement of responsibility
- her Ming Tan, Feifei He
- Language
- eng
- Cataloging source
- GW5XE
- http://library.link/vocab/creatorDate
- 1959-
- http://library.link/vocab/creatorName
- Tan, Cher Ming
- Dewey number
- 621.3815
- Index
- no index present
- LC call number
- TK7874
- LC item number
- .T36 2013
- Literary form
- non fiction
- Nature of contents
-
- dictionaries
- bibliography
- http://library.link/vocab/relatedWorkOrContributorName
- He, Feifei
- Series statement
- SpringerBriefs in applied sciences and technology, Reliability,
- http://library.link/vocab/subjectName
-
- Integrated circuits
- Electrodiffusion
- Label
- Electromigration modeling at circuit layout level, her Ming Tan, Feifei He, (electronic book)
- Antecedent source
- unknown
- Bibliography note
- Includes bibliographical references
- Color
- multicolored
- Contents
-
- Introduction
- 3D Circuit Model Construction and Simulation
- Comparison of EM Performances in Circuit and Test Structures
- Interconnect EM Reliability Modeling at Circuit Layout Level
- Concluding Remarks
- Control code
- SPR834401804
- Dimensions
- unknown
- Extent
- 1 online resource.
- File format
- unknown
- Form of item
- online
- Isbn
- 9789814451215
- Level of compression
- unknown
- Quality assurance targets
- not applicable
- Reformatting quality
- unknown
- Reproduction note
- Electronic resource.
- Sound
- unknown sound
- Specific material designation
- remote
- Label
- Electromigration modeling at circuit layout level, her Ming Tan, Feifei He, (electronic book)
- Antecedent source
- unknown
- Bibliography note
- Includes bibliographical references
- Color
- multicolored
- Contents
-
- Introduction
- 3D Circuit Model Construction and Simulation
- Comparison of EM Performances in Circuit and Test Structures
- Interconnect EM Reliability Modeling at Circuit Layout Level
- Concluding Remarks
- Control code
- SPR834401804
- Dimensions
- unknown
- Extent
- 1 online resource.
- File format
- unknown
- Form of item
- online
- Isbn
- 9789814451215
- Level of compression
- unknown
- Quality assurance targets
- not applicable
- Reformatting quality
- unknown
- Reproduction note
- Electronic resource.
- Sound
- unknown sound
- Specific material designation
- remote
Library Links
Embed
Settings
Select options that apply then copy and paste the RDF/HTML data fragment to include in your application
Embed this data in a secure (HTTPS) page:
Layout options:
Include data citation:
<div class="citation" vocab="http://schema.org/"><i class="fa fa-external-link-square fa-fw"></i> Data from <span resource="http://link.liverpool.ac.uk/portal/Electromigration-modeling-at-circuit-layout/Judy_PNcuN8/" typeof="Book http://bibfra.me/vocab/lite/Item"><span property="name http://bibfra.me/vocab/lite/label"><a href="http://link.liverpool.ac.uk/portal/Electromigration-modeling-at-circuit-layout/Judy_PNcuN8/">Electromigration modeling at circuit layout level, her Ming Tan, Feifei He, (electronic book)</a></span> - <span property="potentialAction" typeOf="OrganizeAction"><span property="agent" typeof="LibrarySystem http://library.link/vocab/LibrarySystem" resource="http://link.liverpool.ac.uk/"><span property="name http://bibfra.me/vocab/lite/label"><a property="url" href="http://link.liverpool.ac.uk/">Sydney Jones Library, University of Liverpool</a></span></span></span></span></div>
Note: Adjust the width and height settings defined in the RDF/HTML code fragment to best match your requirements
Preview
Cite Data - Experimental
Data Citation of the Item Electromigration modeling at circuit layout level, her Ming Tan, Feifei He, (electronic book)
Copy and paste the following RDF/HTML data fragment to cite this resource
<div class="citation" vocab="http://schema.org/"><i class="fa fa-external-link-square fa-fw"></i> Data from <span resource="http://link.liverpool.ac.uk/portal/Electromigration-modeling-at-circuit-layout/Judy_PNcuN8/" typeof="Book http://bibfra.me/vocab/lite/Item"><span property="name http://bibfra.me/vocab/lite/label"><a href="http://link.liverpool.ac.uk/portal/Electromigration-modeling-at-circuit-layout/Judy_PNcuN8/">Electromigration modeling at circuit layout level, her Ming Tan, Feifei He, (electronic book)</a></span> - <span property="potentialAction" typeOf="OrganizeAction"><span property="agent" typeof="LibrarySystem http://library.link/vocab/LibrarySystem" resource="http://link.liverpool.ac.uk/"><span property="name http://bibfra.me/vocab/lite/label"><a property="url" href="http://link.liverpool.ac.uk/">Sydney Jones Library, University of Liverpool</a></span></span></span></span></div>
