Coverart for item
The Resource Field emission scanning electron microscopy : new perspectives for materials characterization, Nicolas Brodusch, Hendrix Demers, Raynald Gauvin

Field emission scanning electron microscopy : new perspectives for materials characterization, Nicolas Brodusch, Hendrix Demers, Raynald Gauvin

Label
Field emission scanning electron microscopy : new perspectives for materials characterization
Title
Field emission scanning electron microscopy
Title remainder
new perspectives for materials characterization
Statement of responsibility
Nicolas Brodusch, Hendrix Demers, Raynald Gauvin
Creator
Contributor
Author
Subject
Language
eng
Summary
This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage
Member of
Cataloging source
N$T
http://library.link/vocab/creatorName
Brodusch, Nicolas
Dewey number
502.8/25
Index
no index present
LC call number
TA417.23
Literary form
non fiction
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorName
  • Demers, Hendrix
  • Gauvin, Raynald
Series statement
SpringerBriefs in applied sciences and technology,
http://library.link/vocab/subjectName
  • Scanning electron microscopy
  • Materials
Label
Field emission scanning electron microscopy : new perspectives for materials characterization, Nicolas Brodusch, Hendrix Demers, Raynald Gauvin
Instantiates
Publication
Antecedent source
unknown
Bibliography note
Includes bibliographical references
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
multicolored
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
SPR1005354030
Dimensions
unknown
Extent
1 online resource.
File format
unknown
Form of item
online
Isbn
9789811044335
Level of compression
unknown
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other control number
10.1007/978-981-10-4433-5
Quality assurance targets
not applicable
Reformatting quality
unknown
Sound
unknown sound
Specific material designation
remote
System control number
  • on1005354030
  • (OCoLC)1005354030
Label
Field emission scanning electron microscopy : new perspectives for materials characterization, Nicolas Brodusch, Hendrix Demers, Raynald Gauvin
Publication
Antecedent source
unknown
Bibliography note
Includes bibliographical references
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
multicolored
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
SPR1005354030
Dimensions
unknown
Extent
1 online resource.
File format
unknown
Form of item
online
Isbn
9789811044335
Level of compression
unknown
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other control number
10.1007/978-981-10-4433-5
Quality assurance targets
not applicable
Reformatting quality
unknown
Sound
unknown sound
Specific material designation
remote
System control number
  • on1005354030
  • (OCoLC)1005354030

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