The Resource Field emission scanning electron microscopy : new perspectives for materials characterization, Nicolas Brodusch, Hendrix Demers, Raynald Gauvin
Field emission scanning electron microscopy : new perspectives for materials characterization, Nicolas Brodusch, Hendrix Demers, Raynald Gauvin
Resource Information
The item Field emission scanning electron microscopy : new perspectives for materials characterization, Nicolas Brodusch, Hendrix Demers, Raynald Gauvin represents a specific, individual, material embodiment of a distinct intellectual or artistic creation found in University of Liverpool.This item is available to borrow from 1 library branch.
Resource Information
The item Field emission scanning electron microscopy : new perspectives for materials characterization, Nicolas Brodusch, Hendrix Demers, Raynald Gauvin represents a specific, individual, material embodiment of a distinct intellectual or artistic creation found in University of Liverpool.
This item is available to borrow from 1 library branch.
- Summary
- This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage
- Language
- eng
- Label
- Field emission scanning electron microscopy : new perspectives for materials characterization
- Title
- Field emission scanning electron microscopy
- Title remainder
- new perspectives for materials characterization
- Statement of responsibility
- Nicolas Brodusch, Hendrix Demers, Raynald Gauvin
- Language
- eng
- Summary
- This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage
- Cataloging source
- N$T
- http://library.link/vocab/creatorName
- Brodusch, Nicolas
- Dewey number
- 502.8/25
- Index
- no index present
- LC call number
- TA417.23
- Literary form
- non fiction
- Nature of contents
-
- dictionaries
- bibliography
- http://library.link/vocab/relatedWorkOrContributorName
-
- Demers, Hendrix
- Gauvin, Raynald
- Series statement
- SpringerBriefs in applied sciences and technology,
- http://library.link/vocab/subjectName
-
- Scanning electron microscopy
- Materials
- Label
- Field emission scanning electron microscopy : new perspectives for materials characterization, Nicolas Brodusch, Hendrix Demers, Raynald Gauvin
- Antecedent source
- unknown
- Bibliography note
- Includes bibliographical references
- Carrier category
- online resource
- Carrier category code
-
- cr
- Carrier MARC source
- rdacarrier
- Color
- multicolored
- Content category
- text
- Content type code
-
- txt
- Content type MARC source
- rdacontent
- Control code
- SPR1005354030
- Dimensions
- unknown
- Extent
- 1 online resource.
- File format
- unknown
- Form of item
- online
- Isbn
- 9789811044335
- Level of compression
- unknown
- Media category
- computer
- Media MARC source
- rdamedia
- Media type code
-
- c
- Other control number
- 10.1007/978-981-10-4433-5
- Quality assurance targets
- not applicable
- Reformatting quality
- unknown
- Sound
- unknown sound
- Specific material designation
- remote
- System control number
-
- on1005354030
- (OCoLC)1005354030
- Label
- Field emission scanning electron microscopy : new perspectives for materials characterization, Nicolas Brodusch, Hendrix Demers, Raynald Gauvin
- Antecedent source
- unknown
- Bibliography note
- Includes bibliographical references
- Carrier category
- online resource
- Carrier category code
-
- cr
- Carrier MARC source
- rdacarrier
- Color
- multicolored
- Content category
- text
- Content type code
-
- txt
- Content type MARC source
- rdacontent
- Control code
- SPR1005354030
- Dimensions
- unknown
- Extent
- 1 online resource.
- File format
- unknown
- Form of item
- online
- Isbn
- 9789811044335
- Level of compression
- unknown
- Media category
- computer
- Media MARC source
- rdamedia
- Media type code
-
- c
- Other control number
- 10.1007/978-981-10-4433-5
- Quality assurance targets
- not applicable
- Reformatting quality
- unknown
- Sound
- unknown sound
- Specific material designation
- remote
- System control number
-
- on1005354030
- (OCoLC)1005354030
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<div class="citation" vocab="http://schema.org/"><i class="fa fa-external-link-square fa-fw"></i> Data from <span resource="http://link.liverpool.ac.uk/portal/Field-emission-scanning-electron-microscopy--new/g-k7ESKzh1A/" typeof="Book http://bibfra.me/vocab/lite/Item"><span property="name http://bibfra.me/vocab/lite/label"><a href="http://link.liverpool.ac.uk/portal/Field-emission-scanning-electron-microscopy--new/g-k7ESKzh1A/">Field emission scanning electron microscopy : new perspectives for materials characterization, Nicolas Brodusch, Hendrix Demers, Raynald Gauvin</a></span> - <span property="potentialAction" typeOf="OrganizeAction"><span property="agent" typeof="LibrarySystem http://library.link/vocab/LibrarySystem" resource="http://link.liverpool.ac.uk/"><span property="name http://bibfra.me/vocab/lite/label"><a property="url" href="http://link.liverpool.ac.uk/">University of Liverpool</a></span></span></span></span></div>
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<div class="citation" vocab="http://schema.org/"><i class="fa fa-external-link-square fa-fw"></i> Data from <span resource="http://link.liverpool.ac.uk/portal/Field-emission-scanning-electron-microscopy--new/g-k7ESKzh1A/" typeof="Book http://bibfra.me/vocab/lite/Item"><span property="name http://bibfra.me/vocab/lite/label"><a href="http://link.liverpool.ac.uk/portal/Field-emission-scanning-electron-microscopy--new/g-k7ESKzh1A/">Field emission scanning electron microscopy : new perspectives for materials characterization, Nicolas Brodusch, Hendrix Demers, Raynald Gauvin</a></span> - <span property="potentialAction" typeOf="OrganizeAction"><span property="agent" typeof="LibrarySystem http://library.link/vocab/LibrarySystem" resource="http://link.liverpool.ac.uk/"><span property="name http://bibfra.me/vocab/lite/label"><a property="url" href="http://link.liverpool.ac.uk/">University of Liverpool</a></span></span></span></span></div>
