The Resource Forensic evidence analysis and crime scene investigation : 20-21 November 1996, Boston, Massachusetts, John Hicks, Peter R. De Forest, Vivian M. Baylor, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cosponsored by National Institute of Standards and Technology ... [et al.] ; cooperating organizations, National Institute of Justice ... [et al.], (electronic book)

Forensic evidence analysis and crime scene investigation : 20-21 November 1996, Boston, Massachusetts, John Hicks, Peter R. De Forest, Vivian M. Baylor, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cosponsored by National Institute of Standards and Technology ... [et al.] ; cooperating organizations, National Institute of Justice ... [et al.], (electronic book)

Label
Forensic evidence analysis and crime scene investigation : 20-21 November 1996, Boston, Massachusetts
Title
Forensic evidence analysis and crime scene investigation
Title remainder
20-21 November 1996, Boston, Massachusetts
Statement of responsibility
John Hicks, Peter R. De Forest, Vivian M. Baylor, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cosponsored by National Institute of Standards and Technology ... [et al.] ; cooperating organizations, National Institute of Justice ... [et al.]
Contributor
Subject
Genre
Language
eng
Member of
Cataloging source
SPIED
Illustrations
illustrations
Index
index present
LC call number
HV8073
LC item number
.F565 1997
Literary form
non fiction
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorDate
1945-
http://library.link/vocab/relatedWorkOrContributorName
  • Hicks, John
  • De Forest, Peter R
  • Baylor, Vivian M
  • National Institute of Standards and Technology (U.S.)
  • National Institute of Justice (U.S.)
  • Society of Photo-optical Instrumentation Engineers
  • SPIE Digital Library
Series statement
Proceedings / SPIE--the International Society for Optical Engineering,
Series volume
2941
http://library.link/vocab/subjectName
  • Electronics in criminal investigation
  • Crime scene searches
  • Forensic sciences
  • Law enforcement
Label
Forensic evidence analysis and crime scene investigation : 20-21 November 1996, Boston, Massachusetts, John Hicks, Peter R. De Forest, Vivian M. Baylor, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cosponsored by National Institute of Standards and Technology ... [et al.] ; cooperating organizations, National Institute of Justice ... [et al.], (electronic book)
Instantiates
Publication
Bibliography note
Includes bibliographical references and author index
Dimensions
28 cm.
Dimensions
unknown
Extent
v, 148 p.
Form of item
electronic
Other physical details
ill.
Reproduction note
Electronic resource.
Specific material designation
remote
Label
Forensic evidence analysis and crime scene investigation : 20-21 November 1996, Boston, Massachusetts, John Hicks, Peter R. De Forest, Vivian M. Baylor, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cosponsored by National Institute of Standards and Technology ... [et al.] ; cooperating organizations, National Institute of Justice ... [et al.], (electronic book)
Publication
Bibliography note
Includes bibliographical references and author index
Dimensions
28 cm.
Dimensions
unknown
Extent
v, 148 p.
Form of item
electronic
Other physical details
ill.
Reproduction note
Electronic resource.
Specific material designation
remote

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