Coverart for item
The Resource ICMTS 1998 : proceedings of the 1998 IEEE International Conference on Microelectronic Test Structures, March 23-26, 1998, Kanazawa, Japan, sponsored by the IEEE Electron Devices Society

ICMTS 1998 : proceedings of the 1998 IEEE International Conference on Microelectronic Test Structures, March 23-26, 1998, Kanazawa, Japan, sponsored by the IEEE Electron Devices Society

Label
ICMTS 1998 : proceedings of the 1998 IEEE International Conference on Microelectronic Test Structures, March 23-26, 1998, Kanazawa, Japan
Title
ICMTS 1998
Title remainder
proceedings of the 1998 IEEE International Conference on Microelectronic Test Structures, March 23-26, 1998, Kanazawa, Japan
Statement of responsibility
sponsored by the IEEE Electron Devices Society
Title variation
Microelectronic Test Structures, 1998, ICMTS 1998, proceedings of the 1998 International Conference on
Creator
Contributor
Subject
Genre
Language
eng
Member of
Cataloging source
OCL
Dewey number
621.381548
Illustrations
illustrations
Index
index present
Language note
English
LC call number
TK7874
LC item number
.I3233 1998
Literary form
non fiction
http://bibfra.me/vocab/lite/meetingDate
1998
http://bibfra.me/vocab/lite/meetingName
IEEE International Conference on Microelectronic Test Structures
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorName
IEEE Electron Devices Society
http://library.link/vocab/subjectName
  • Integrated circuits
  • Semiconductors
  • Electronic apparatus and appliances
Label
ICMTS 1998 : proceedings of the 1998 IEEE International Conference on Microelectronic Test Structures, March 23-26, 1998, Kanazawa, Japan, sponsored by the IEEE Electron Devices Society
Instantiates
Publication
Note
"IEEE catalog number: 98CH36157"--Title page verso
Bibliography note
Includes bibliographical references and index
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
IEEE47873612
Dimensions
unknown
Extent
1 online resource (x, 240 pages)
Form of item
online
Isbn
9780780343498
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations
Sound
unknown sound
Specific material designation
remote
System control number
  • ocm47873612\
  • (OCoLC)47873612
Label
ICMTS 1998 : proceedings of the 1998 IEEE International Conference on Microelectronic Test Structures, March 23-26, 1998, Kanazawa, Japan, sponsored by the IEEE Electron Devices Society
Publication
Note
"IEEE catalog number: 98CH36157"--Title page verso
Bibliography note
Includes bibliographical references and index
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
IEEE47873612
Dimensions
unknown
Extent
1 online resource (x, 240 pages)
Form of item
online
Isbn
9780780343498
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations
Sound
unknown sound
Specific material designation
remote
System control number
  • ocm47873612\
  • (OCoLC)47873612

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