Coverart for item
The Resource ICMTS 2004 : proceedings of the 2004 International Conference on Microelectronic Test Structures : March 22-25, 2004, Awaji Yumebutai International Conference Center, Japan, sponsored by the IEEE Electron Devices Society

ICMTS 2004 : proceedings of the 2004 International Conference on Microelectronic Test Structures : March 22-25, 2004, Awaji Yumebutai International Conference Center, Japan, sponsored by the IEEE Electron Devices Society

Label
ICMTS 2004 : proceedings of the 2004 International Conference on Microelectronic Test Structures : March 22-25, 2004, Awaji Yumebutai International Conference Center, Japan
Title
ICMTS 2004
Title remainder
proceedings of the 2004 International Conference on Microelectronic Test Structures : March 22-25, 2004, Awaji Yumebutai International Conference Center, Japan
Statement of responsibility
sponsored by the IEEE Electron Devices Society
Title variation
  • Proceedings of the 2004 International Conference on Microelectronic Test Structures
  • 2004 International Conference on Microelectronic Test Structures
Creator
Contributor
Subject
Genre
Language
eng
Related
Member of
Cataloging source
AZU
Illustrations
illustrations
Index
index present
Language note
English
LC call number
TK7874
LC item number
.I59 2004
Literary form
non fiction
http://bibfra.me/vocab/lite/meetingDate
2004
http://bibfra.me/vocab/lite/meetingName
IEEE International Conference on Microelectronic Test Structures
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorName
IEEE Electron Devices Society
http://library.link/vocab/subjectName
  • Integrated circuits
  • Semiconductors
  • Electronic apparatus and appliances
Label
ICMTS 2004 : proceedings of the 2004 International Conference on Microelectronic Test Structures : March 22-25, 2004, Awaji Yumebutai International Conference Center, Japan, sponsored by the IEEE Electron Devices Society
Instantiates
Publication
Note
"IEEE Catalog Number: 04CH37516"--Title page verso
Bibliography note
Includes bibliographical references and author index
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
mixed
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
IEEE55858049
Dimensions
unknown
Extent
1 online resource (xii, 313 pages)
Form of item
online
Isbn
9780780382626
Lccn
2003114789
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations
Sound
unknown sound
Specific material designation
remote
System control number
  • ocm55858049\
  • (OCoLC)55858049
Label
ICMTS 2004 : proceedings of the 2004 International Conference on Microelectronic Test Structures : March 22-25, 2004, Awaji Yumebutai International Conference Center, Japan, sponsored by the IEEE Electron Devices Society
Publication
Note
"IEEE Catalog Number: 04CH37516"--Title page verso
Bibliography note
Includes bibliographical references and author index
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
mixed
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
IEEE55858049
Dimensions
unknown
Extent
1 online resource (xii, 313 pages)
Form of item
online
Isbn
9780780382626
Lccn
2003114789
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations
Sound
unknown sound
Specific material designation
remote
System control number
  • ocm55858049\
  • (OCoLC)55858049

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