Coverart for item
The Resource ICMTS 2005 : proceedings of the 2005 International Conference on Microelectronic Test Structures, April 4-7, 2005, De Valk, Tiensestraat 41, Leuven, Belgium, sponsored by the IEEE Electron Devices Society

ICMTS 2005 : proceedings of the 2005 International Conference on Microelectronic Test Structures, April 4-7, 2005, De Valk, Tiensestraat 41, Leuven, Belgium, sponsored by the IEEE Electron Devices Society

Label
ICMTS 2005 : proceedings of the 2005 International Conference on Microelectronic Test Structures, April 4-7, 2005, De Valk, Tiensestraat 41, Leuven, Belgium
Title
ICMTS 2005
Title remainder
proceedings of the 2005 International Conference on Microelectronic Test Structures, April 4-7, 2005, De Valk, Tiensestraat 41, Leuven, Belgium
Statement of responsibility
sponsored by the IEEE Electron Devices Society
Title variation
  • Proceedings of the 2005 International Conference on Microelectronic Test Structures
  • 2005 International Conference on Microelectronic Test Structures
  • Proc. IEEE 2005 Int. Conference on Microelectronic Test Structures, Vol. 18, April 2005
Creator
Contributor
Subject
Genre
Language
eng
Related
Member of
Cataloging source
AZU
Illustrations
illustrations
Index
index present
LC call number
TK7874
LC item number
.I324 2005eb
Literary form
non fiction
http://bibfra.me/vocab/lite/meetingDate
2005
http://bibfra.me/vocab/lite/meetingName
IEEE International Conference on Microelectronic Test Structures
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorName
IEEE Electron Devices Society
http://library.link/vocab/subjectName
  • Integrated circuits
  • Semiconductors
  • Electronic apparatus and appliances
Label
ICMTS 2005 : proceedings of the 2005 International Conference on Microelectronic Test Structures, April 4-7, 2005, De Valk, Tiensestraat 41, Leuven, Belgium, sponsored by the IEEE Electron Devices Society
Instantiates
Publication
Note
"IEEE Catalog Number: 05CH37622"--Title page verso
Bibliography note
Includes bibliographical references and author index
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
mixed
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
IEEE61185495
Dimensions
unknown
Extent
1 online resource (xii, 270 pages)
Form of item
online
Isbn
9780780388550
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations
Sound
unknown sound
Specific material designation
remote
System control number
  • ocm61185495\
  • (OCoLC)61185495
Label
ICMTS 2005 : proceedings of the 2005 International Conference on Microelectronic Test Structures, April 4-7, 2005, De Valk, Tiensestraat 41, Leuven, Belgium, sponsored by the IEEE Electron Devices Society
Publication
Note
"IEEE Catalog Number: 05CH37622"--Title page verso
Bibliography note
Includes bibliographical references and author index
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
mixed
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
IEEE61185495
Dimensions
unknown
Extent
1 online resource (xii, 270 pages)
Form of item
online
Isbn
9780780388550
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations
Sound
unknown sound
Specific material designation
remote
System control number
  • ocm61185495\
  • (OCoLC)61185495

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