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The Resource IEEE 23rd North Atlantic Test Workshop : proceedings : 14-16 May 2014, Binghampton, New York, sponsored by IEEE Binghamton Section

IEEE 23rd North Atlantic Test Workshop : proceedings : 14-16 May 2014, Binghampton, New York, sponsored by IEEE Binghamton Section

Label
IEEE 23rd North Atlantic Test Workshop : proceedings : 14-16 May 2014, Binghampton, New York
Title
IEEE 23rd North Atlantic Test Workshop
Title remainder
proceedings : 14-16 May 2014, Binghampton, New York
Statement of responsibility
sponsored by IEEE Binghamton Section
Title variation
  • Twenty-third North Atlantic Test Workshop
  • North Atlantic Test Workshop (NATW), 2014 IEEE 23rd
  • 2014 IEEE 23rd North Atlantic Test Workshop (NATW)
  • NATW 2014
Creator
Contributor
Issuing body
Sponsoring body
Subject
Genre
Language
eng
Summary
Annotation
Member of
Cataloging source
COO
Illustrations
illustrations
Index
index present
LC call number
TK7895.E42
LC item number
I345 2014
Literary form
non fiction
http://bibfra.me/vocab/lite/meetingDate
2014
http://bibfra.me/vocab/lite/meetingName
IEEE North Atlantic Test Workshop
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorName
  • Institute of Electrical and Electronics Engineers
  • IEEE Computer Society
http://library.link/vocab/subjectName
  • Embedded computer systems
  • Random access memory
  • Systems on a chip
  • Integrated circuits
Summary expansion
The IEEE North Atlantic Test Workshop provides a forum for discussions on the latest issues relating to high quality, economical, and efficient test methodologies and designs The 22nd NATW will feature a half day tutorial on Wednesday titled VLSI Test and Security The program includes a keynote by Brian Gaucher (IBM) on Smart Power Grids and an invited address by Stephen Sunter (Mentor Graphics) on Analog Mixed signal Test In addition to traditional topics, the 22nd NATW will feature a general theme of Growing importance of Test and Hardware Security Topics are not limited to, the following Analog, Mixed Signal & RF Testing Built In Self Test (BIST) Board Level Testing Delay & Performance Testing Design Verification Validation Diagnosis and Debug Fault Modeling Simulation FPGA & Embedded Core Testing IDDQ Testing DFM, Defect Analysis & Defect Based Testing Memory & MEMS Testing Nanotechnology Testing Online Testing System on Chip (SoC) Test & Debug Test Quality System Reliabi
Label
IEEE 23rd North Atlantic Test Workshop : proceedings : 14-16 May 2014, Binghampton, New York, sponsored by IEEE Binghamton Section
Instantiates
Publication
Copyright
Note
"IEEE Computer Society Order Number E5228, BMS Part Number CFP14NAT-CDR."
Bibliography note
Includes bibliographical references and author index
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
multicolored
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
IEEE893191933
Dimensions
unknown
Extent
1 online resource (xii, 80 pages)
Form of item
online
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations
Specific material designation
remote
System control number
  • ocn893191933
  • (OCoLC)893191933
Label
IEEE 23rd North Atlantic Test Workshop : proceedings : 14-16 May 2014, Binghampton, New York, sponsored by IEEE Binghamton Section
Publication
Copyright
Note
"IEEE Computer Society Order Number E5228, BMS Part Number CFP14NAT-CDR."
Bibliography note
Includes bibliographical references and author index
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
multicolored
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
IEEE893191933
Dimensions
unknown
Extent
1 online resource (xii, 80 pages)
Form of item
online
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations
Specific material designation
remote
System control number
  • ocn893191933
  • (OCoLC)893191933

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