Coverart for item
The Resource ISTFA 2005 : Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California, sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2005, ASTM International, (electronic book)

ISTFA 2005 : Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California, sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2005, ASTM International, (electronic book)

Label
ISTFA 2005 : Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California
Title
ISTFA 2005
Title remainder
Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California
Statement of responsibility
sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2005, ASTM International
Creator
Subject
Genre
Language
eng
Member of
Cataloging source
CaPaEBR
Illustrations
illustrations
Index
index present
LC call number
TK7871
LC item number
.I63 2005eb
Literary form
non fiction
http://bibfra.me/vocab/lite/meetingDate
d2005
http://bibfra.me/vocab/lite/meetingName
International Symposium for Testing and Failure Analysis
Nature of contents
  • standards specifications
  • bibliography
http://library.link/vocab/subjectName
  • Electronics
  • Electronic apparatus and appliances
Label
ISTFA 2005 : Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California, sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2005, ASTM International, (electronic book)
Instantiates
Publication
Bibliography note
Includes bibliographical references and index
Color
multicolored
Control code
ebr10323479
Dimensions
unknown
Extent
xviii, 524 p.
Form of item
electronic
Isbn
9780871708236
Original version note
Original electronic resource
Other physical details
ill.
Reproduction note
Electronic resource.
Specific material designation
remote
Label
ISTFA 2005 : Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California, sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2005, ASTM International, (electronic book)
Publication
Bibliography note
Includes bibliographical references and index
Color
multicolored
Control code
ebr10323479
Dimensions
unknown
Extent
xviii, 524 p.
Form of item
electronic
Isbn
9780871708236
Original version note
Original electronic resource
Other physical details
ill.
Reproduction note
Electronic resource.
Specific material designation
remote

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