Coverart for item
The Resource ISTFA 2009 : conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA, sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International, (electronic book)

ISTFA 2009 : conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA, sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International, (electronic book)

Label
ISTFA 2009 : conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA
Title
ISTFA 2009
Title remainder
conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA
Statement of responsibility
sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International
Creator
Subject
Genre
Language
eng
Member of
Cataloging source
CaPaEBR
Illustrations
illustrations
Index
index present
LC call number
TK7871
LC item number
.I58 2009eb
Literary form
non fiction
http://bibfra.me/vocab/lite/meetingDate
2009
http://bibfra.me/vocab/lite/meetingName
International Symposium for Testing and Failure Analysis
Nature of contents
  • standards specifications
  • bibliography
http://library.link/vocab/subjectName
  • Electronic apparatus and appliances
  • Electronics
Label
ISTFA 2009 : conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA, sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International, (electronic book)
Instantiates
Publication
Bibliography note
Includes bibliographical references and index
Color
multicolored
Control code
ebr10374914
Dimensions
unknown
Extent
xvi, 355 p.
Form of item
electronic
Isbn
9781615030088
Original version note
Original electronic resource
Other physical details
ill.
Reproduction note
Electronic resource.
Specific material designation
remote
Label
ISTFA 2009 : conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA, sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International, (electronic book)
Publication
Bibliography note
Includes bibliographical references and index
Color
multicolored
Control code
ebr10374914
Dimensions
unknown
Extent
xvi, 355 p.
Form of item
electronic
Isbn
9781615030088
Original version note
Original electronic resource
Other physical details
ill.
Reproduction note
Electronic resource.
Specific material designation
remote

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