The Resource ISTFA 2011 : conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA, sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International, (electronic book)

ISTFA 2011 : conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA, sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International, (electronic book)

Label
ISTFA 2011 : conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA
Title
ISTFA 2011
Title remainder
conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA
Statement of responsibility
sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International
Creator
Subject
Genre
Language
eng
Member of
Cataloging source
CaPaEBR
Illustrations
illustrations
Index
index present
LC call number
TK7871
LC item number
.I58 2011eb
Literary form
non fiction
http://bibfra.me/vocab/lite/meetingDate
2011
http://bibfra.me/vocab/lite/meetingName
International Symposium for Testing and Failure Analysis
Nature of contents
  • standards specifications
  • bibliography
http://library.link/vocab/subjectName
  • Electronics
  • Electronic apparatus and appliances
Label
ISTFA 2011 : conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA, sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International, (electronic book)
Instantiates
Publication
Bibliography note
Includes bibliographical references and index
Color
multicolored
Control code
ebr10540844
Dimensions
unknown
Extent
xix, 456 p.
Form of item
electronic
Original version note
Original electronic resource
Other physical details
col. ill.
Reproduction note
Electronic resource.
Specific material designation
remote
Label
ISTFA 2011 : conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA, sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International, (electronic book)
Publication
Bibliography note
Includes bibliographical references and index
Color
multicolored
Control code
ebr10540844
Dimensions
unknown
Extent
xix, 456 p.
Form of item
electronic
Original version note
Original electronic resource
Other physical details
col. ill.
Reproduction note
Electronic resource.
Specific material designation
remote

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