Coverart for item
The Resource Instrumentation, metrology, and standards for nanomanufacturing, optics, and semiconductors VI : 13-14 August 2012, San Diego, California, United States, Michael T. Postek, Victoria A. Coleman, Ndubuisi G. Orji, editors ; sponsored and published by SPIE

Instrumentation, metrology, and standards for nanomanufacturing, optics, and semiconductors VI : 13-14 August 2012, San Diego, California, United States, Michael T. Postek, Victoria A. Coleman, Ndubuisi G. Orji, editors ; sponsored and published by SPIE

Label
Instrumentation, metrology, and standards for nanomanufacturing, optics, and semiconductors VI : 13-14 August 2012, San Diego, California, United States
Title
Instrumentation, metrology, and standards for nanomanufacturing, optics, and semiconductors VI
Title remainder
13-14 August 2012, San Diego, California, United States
Statement of responsibility
Michael T. Postek, Victoria A. Coleman, Ndubuisi G. Orji, editors ; sponsored and published by SPIE
Contributor
Subject
Genre
Language
eng
Related
Member of
Cataloging source
COO
http://bibfra.me/vocab/lite/collectionName
SPIE digital library
Dewey number
620.1/115
Illustrations
illustrations
Index
no index present
LC call number
TA418.9.N35
LC item number
I57 2012
Literary form
non fiction
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorDate
1981-
http://library.link/vocab/relatedWorkOrContributorName
  • Postek, Michael T
  • Coleman, Victoria Anne
  • Orji, Ndubuisi G
  • SPIE (Society)
  • National Institute of Standards and Technology (U.S.)
Series statement
Proceedings of SPIE,
Series volume
v. 8466
http://library.link/vocab/subjectName
  • Nanostructured materials
  • Microfabrication
  • Nanotechnology
Label
Instrumentation, metrology, and standards for nanomanufacturing, optics, and semiconductors VI : 13-14 August 2012, San Diego, California, United States, Michael T. Postek, Victoria A. Coleman, Ndubuisi G. Orji, editors ; sponsored and published by SPIE
Instantiates
Publication
Note
Previous conference titled: Instrumentation, metrology, and standards for nanomanufacturing V
Bibliography note
Includes bibliographical references
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Dimensions
unknown
Extent
1 online resource (1 online resource)
Form of item
online
Isbn
9780819491831
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations (some color).
Specific material designation
remote
Label
Instrumentation, metrology, and standards for nanomanufacturing, optics, and semiconductors VI : 13-14 August 2012, San Diego, California, United States, Michael T. Postek, Victoria A. Coleman, Ndubuisi G. Orji, editors ; sponsored and published by SPIE
Publication
Note
Previous conference titled: Instrumentation, metrology, and standards for nanomanufacturing V
Bibliography note
Includes bibliographical references
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Dimensions
unknown
Extent
1 online resource (1 online resource)
Form of item
online
Isbn
9780819491831
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations (some color).
Specific material designation
remote

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