Coverart for item
The Resource Instrumentation, metrology, and standards for nanomanufacturing, optics and semiconductors VIII : 20 August 2014, San Diego, California, United States, Michael T. Postek, Ndubuisi G. Orji, editors ; sponsored and published by SPIE

Instrumentation, metrology, and standards for nanomanufacturing, optics and semiconductors VIII : 20 August 2014, San Diego, California, United States, Michael T. Postek, Ndubuisi G. Orji, editors ; sponsored and published by SPIE

Label
Instrumentation, metrology, and standards for nanomanufacturing, optics and semiconductors VIII : 20 August 2014, San Diego, California, United States
Title
Instrumentation, metrology, and standards for nanomanufacturing, optics and semiconductors VIII
Title remainder
20 August 2014, San Diego, California, United States
Statement of responsibility
Michael T. Postek, Ndubuisi G. Orji, editors ; sponsored and published by SPIE
Contributor
Editor
Issuing body
Sponsoring body
Subject
Genre
Language
eng
Member of
Cataloging source
COO
Illustrations
illustrations
Index
no index present
LC call number
TA418.9.N35
LC item number
I57 2014e
Literary form
non fiction
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorName
  • Postek, Michael T.
  • Orji, Ndubuisi George
  • SPIE (Society)
Series statement
Proceedings of SPIE,
Series volume
volume 9173
http://library.link/vocab/subjectName
  • Nanostructured materials
  • Microfabrication
  • Nanotechnology
Label
Instrumentation, metrology, and standards for nanomanufacturing, optics and semiconductors VIII : 20 August 2014, San Diego, California, United States, Michael T. Postek, Ndubuisi G. Orji, editors ; sponsored and published by SPIE
Instantiates
Publication
Copyright
Bibliography note
Includes bibliographical references
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Dimensions
unknown
Extent
1 online resource
Form of item
online
Isbn
9781628412000
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations (some color).
Specific material designation
remote
Label
Instrumentation, metrology, and standards for nanomanufacturing, optics and semiconductors VIII : 20 August 2014, San Diego, California, United States, Michael T. Postek, Ndubuisi G. Orji, editors ; sponsored and published by SPIE
Publication
Copyright
Bibliography note
Includes bibliographical references
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Dimensions
unknown
Extent
1 online resource
Form of item
online
Isbn
9781628412000
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations (some color).
Specific material designation
remote

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