Coverart for item
The Resource International Symposium on Quality Electronic Design : proceedings : 18-21 March, 2002, San Jose, California, sponsored by IEEE Technical Committee on VLSI Design (TCVLSI) [and others]

International Symposium on Quality Electronic Design : proceedings : 18-21 March, 2002, San Jose, California, sponsored by IEEE Technical Committee on VLSI Design (TCVLSI) [and others]

Label
International Symposium on Quality Electronic Design : proceedings : 18-21 March, 2002, San Jose, California
Title
International Symposium on Quality Electronic Design
Title remainder
proceedings : 18-21 March, 2002, San Jose, California
Statement of responsibility
sponsored by IEEE Technical Committee on VLSI Design (TCVLSI) [and others]
Title variation
  • Proceedings of the 2002 3rd International Symposium on Quality Electronic Design
  • ISQED 2002
  • IEEE ISQED 2002
  • Quality electronic design
Title variation remainder
IEEE ISQED 2002
Creator
Contributor
Subject
Genre
Language
eng
Related
Member of
Cataloging source
WAU
Dewey number
621.39/5
Illustrations
illustrations
Index
index present
Language note
English
LC call number
TK7874.75
LC item number
.I565 2002a
Literary form
non fiction
http://bibfra.me/vocab/lite/meetingDate
2002
http://bibfra.me/vocab/lite/meetingName
International Symposium on Quality Electronic Design
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorName
IEEE Computer Society
http://library.link/vocab/subjectName
  • Integrated circuits
  • Integrated circuits
  • Integrated circuits
  • Integrated circuits
  • Electrical Engineering
Label
International Symposium on Quality Electronic Design : proceedings : 18-21 March, 2002, San Jose, California, sponsored by IEEE Technical Committee on VLSI Design (TCVLSI) [and others]
Instantiates
Publication
Note
"IEEE Computer Society Order Number PR01561"--Title page verso
Bibliography note
Includes bibliographical references and author index
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Contents
  • Hot Carrier Reliability and Design Considerations
  • Interconnect and Device Modeling for Quality Design
  • Power/Ground Integrity Issues for Sub-130nm IC Designs
  • A General and Comparative Study of RC[superscript (0)], RC, RCL and RCLK Modeling of Interconnects and Their Impact on the Design of Multi-Giga Hertz Processors
  • MOS Modeling, Design Quality, and Modern Analog Design
  • Title: RLCK Extraction and Simulation in High-Speed SoC Designs
  • Design Flows and Methodologies
  • nVHDL: A Hardware Design Language for Modeling Discrete and Analog Design and Simulation of Mixed-Signal Electronic Systems
  • Platform-Based Design: A Tutorial
  • Quality Aspects of SOI Circuit Design
  • ISQED Tutorials
  • Optimization in an Integrated Physical Design Flow
  • Evening Panel Discussion: Are the Interoperability Standards for EDA Too Little/Too Late for Real SoC Designs?
  • Plenary Session I
  • IP Reuse Quality: "Intellectual Property" or "Intense Pain"?
  • J. Chilton
  • Why Integrated Yield Management is a Necessity
  • Y. Lepejian
  • Design Success: Foundry Perspective
  • J. Kupec
  • What You Don't Know CAN Hurt You: Designing for Survival in a Sub-wavelength Environment
  • Test Methodologies for Quality Designs
  • Y. Pati
  • Design-for-Test Techniques for SoC Designs
  • Supplemental Test Methods
  • Design for Reliability in UDSM: Issues and Solutions
  • Issues in Deep Submicron State-of-the-Art ESD Design
  • Electromigration Reliability Issues in High-Performance Circuit Design
  • Ultra-thin Gate Oxide Reliability and Implications for Design
Control code
IEEE52172248
Dimensions
unknown
Extent
1 online resource (xxii, 549 pages)
Form of item
online
Isbn
9780769515618
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations
Specific material designation
remote
System control number
  • ocm52172248\
  • (OCoLC)52172248
Label
International Symposium on Quality Electronic Design : proceedings : 18-21 March, 2002, San Jose, California, sponsored by IEEE Technical Committee on VLSI Design (TCVLSI) [and others]
Publication
Note
"IEEE Computer Society Order Number PR01561"--Title page verso
Bibliography note
Includes bibliographical references and author index
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Contents
  • Hot Carrier Reliability and Design Considerations
  • Interconnect and Device Modeling for Quality Design
  • Power/Ground Integrity Issues for Sub-130nm IC Designs
  • A General and Comparative Study of RC[superscript (0)], RC, RCL and RCLK Modeling of Interconnects and Their Impact on the Design of Multi-Giga Hertz Processors
  • MOS Modeling, Design Quality, and Modern Analog Design
  • Title: RLCK Extraction and Simulation in High-Speed SoC Designs
  • Design Flows and Methodologies
  • nVHDL: A Hardware Design Language for Modeling Discrete and Analog Design and Simulation of Mixed-Signal Electronic Systems
  • Platform-Based Design: A Tutorial
  • Quality Aspects of SOI Circuit Design
  • ISQED Tutorials
  • Optimization in an Integrated Physical Design Flow
  • Evening Panel Discussion: Are the Interoperability Standards for EDA Too Little/Too Late for Real SoC Designs?
  • Plenary Session I
  • IP Reuse Quality: "Intellectual Property" or "Intense Pain"?
  • J. Chilton
  • Why Integrated Yield Management is a Necessity
  • Y. Lepejian
  • Design Success: Foundry Perspective
  • J. Kupec
  • What You Don't Know CAN Hurt You: Designing for Survival in a Sub-wavelength Environment
  • Test Methodologies for Quality Designs
  • Y. Pati
  • Design-for-Test Techniques for SoC Designs
  • Supplemental Test Methods
  • Design for Reliability in UDSM: Issues and Solutions
  • Issues in Deep Submicron State-of-the-Art ESD Design
  • Electromigration Reliability Issues in High-Performance Circuit Design
  • Ultra-thin Gate Oxide Reliability and Implications for Design
Control code
IEEE52172248
Dimensions
unknown
Extent
1 online resource (xxii, 549 pages)
Form of item
online
Isbn
9780769515618
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations
Specific material designation
remote
System control number
  • ocm52172248\
  • (OCoLC)52172248

Library Locations

Processing Feedback ...