Coverart for item
The Resource International Test Conference 2010 Proceedings : October 31-November 5, 2010, Austin Convention Center, Austin, Texas, USA, sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section

International Test Conference 2010 Proceedings : October 31-November 5, 2010, Austin Convention Center, Austin, Texas, USA, sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section

Label
International Test Conference 2010 Proceedings : October 31-November 5, 2010, Austin Convention Center, Austin, Texas, USA
Title
International Test Conference 2010 Proceedings
Title remainder
October 31-November 5, 2010, Austin Convention Center, Austin, Texas, USA
Statement of responsibility
sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section
Title variation
  • ITC 2010
  • Test Conference (ITC), 2010 IEEE International
  • 2010 IEEE International Test Conference (ITC)
Creator
Contributor
Sponsoring body
Subject
Genre
Language
eng
Member of
Cataloging source
COO
Illustrations
illustrations
Index
no index present
Literary form
non fiction
http://bibfra.me/vocab/lite/meetingDate
2010
http://bibfra.me/vocab/lite/meetingName
International Test Conference
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorName
  • IEEE Computer Society
  • Institute of Electrical and Electronics Engineers
  • Institute of Electrical and Electronics Engineers
http://library.link/vocab/subjectName
  • Computer software
  • Semiconductors
  • Radio frequency
  • Telecommunication
  • Electronic digital computers
  • Integrated circuits
Label
International Test Conference 2010 Proceedings : October 31-November 5, 2010, Austin Convention Center, Austin, Texas, USA, sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section
Instantiates
Publication
Note
"IEEE Catalog Number: CFP10ITC-CDR."
Bibliography note
Includes bibliographical references and author index
Carrier category
online resource
Carrier category code
  • cr
Carrier MARC source
rdacarrier
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Control code
IEEE812633970
Dimensions
unknown
Extent
1 online resource
Form of item
online
Media category
computer
Media MARC source
rdamedia
Media type code
  • c
Other physical details
illustrations
Specific material designation
remote
System control number
  • ocn812633970
  • (OCoLC)812633970
Label
International Test Conference 2010 Proceedings : October 31-November 5, 2010, Austin Convention Center, Austin, Texas, USA, sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section
Publication
Note
"IEEE Catalog Number: CFP10ITC-CDR."
Bibliography note
Includes bibliographical references and author index
Carrier category
online resource
Carrier category code
  • cr
Carrier MARC source
rdacarrier
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Control code
IEEE812633970
Dimensions
unknown
Extent
1 online resource
Form of item
online
Media category
computer
Media MARC source
rdamedia
Media type code
  • c
Other physical details
illustrations
Specific material designation
remote
System control number
  • ocn812633970
  • (OCoLC)812633970

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