Coverart for item
The Resource International Workshop on Memory Technology, Design and Testing : proceedings, sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI in cooperation with IEEE Solid-State Circuits Society ; edited by F. Lombardi, R. Rajsuman, and T. Wik

International Workshop on Memory Technology, Design and Testing : proceedings, sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI in cooperation with IEEE Solid-State Circuits Society ; edited by F. Lombardi, R. Rajsuman, and T. Wik

Label
International Workshop on Memory Technology, Design and Testing : proceedings
Title
International Workshop on Memory Technology, Design and Testing
Title remainder
proceedings
Statement of responsibility
sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI in cooperation with IEEE Solid-State Circuits Society ; edited by F. Lombardi, R. Rajsuman, and T. Wik
Title variation
  • Records of the IEEE International Workshop on Memory Technology, Design and Testing 1997
  • Memory technology, design and testing
  • Proceedings.
Title variation remainder
International workshop on memory technology, design and testing
Creator
Contributor
Subject
Genre
Language
eng
Summary
Annotation
Member of
Cataloging source
UWW
Dewey number
621.39/732
Index
no index present
LC call number
TK7895.M4I334 2001
Literary form
non fiction
http://bibfra.me/vocab/lite/meetingDate
1997
http://bibfra.me/vocab/lite/meetingName
IEEE International Workshop on Memory Technology, Design, and Testing
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorDate
1955-
http://library.link/vocab/relatedWorkOrContributorName
  • Rajsuman, Rochit
  • Lombardi, Fabrizio
  • Wik, T.
  • IEEE Computer Society
  • IEEE Computer Society
  • IEEE Solid-State Circuits Council
http://library.link/vocab/subjectName
  • Random access memory
  • Semiconductor storage devices
Summary expansion
The 14 papers in this collection from the August 2001 workshop are divided into five sessions on semiconductor memory design, BIST, redundancy and error control, fault models and multi-port SRAM testing, and verification and testing. Some of the topics are evaluation of redundancy analysis algorithms, a parallel approach for testing multi-port static random access memories, a low output resistance charge pump for flash memory programming, BIST-based bitfail mapping of an embedded DRAM, and an orthogonal transpose- RAM cell array architecture with an alternate bit-line to bit-line contact scheme. No subject index. c. Book News Inc
Label
International Workshop on Memory Technology, Design and Testing : proceedings, sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI in cooperation with IEEE Solid-State Circuits Society ; edited by F. Lombardi, R. Rajsuman, and T. Wik
Instantiates
Publication
Note
  • IEEE catalog number: 97TB100159
  • Held on August 11-12, 1997, San Jose, California
  • Title from title screen
Bibliography note
Includes bibliographical references
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
multicolored
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
IEEE71486826
Dimensions
unknown
Extent
1 online resource.
File format
multiple file formats
Form of item
online
Isbn
9780818684968
Media category
computer
Media MARC source
rdamedia
Media type code
c
Specific material designation
remote
System control number
  • ocm71486826\
  • (OCoLC)71486826
Label
International Workshop on Memory Technology, Design and Testing : proceedings, sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI in cooperation with IEEE Solid-State Circuits Society ; edited by F. Lombardi, R. Rajsuman, and T. Wik
Publication
Note
  • IEEE catalog number: 97TB100159
  • Held on August 11-12, 1997, San Jose, California
  • Title from title screen
Bibliography note
Includes bibliographical references
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
multicolored
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
IEEE71486826
Dimensions
unknown
Extent
1 online resource.
File format
multiple file formats
Form of item
online
Isbn
9780818684968
Media category
computer
Media MARC source
rdamedia
Media type code
c
Specific material designation
remote
System control number
  • ocm71486826\
  • (OCoLC)71486826

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