Coverart for item
The Resource Kelvin Probe Force Microscopy : From Single Charge Detection to Device Characterization, edited by Sascha Sadewasser, Thilo Glatzel, (electronic book)

Kelvin Probe Force Microscopy : From Single Charge Detection to Device Characterization, edited by Sascha Sadewasser, Thilo Glatzel, (electronic book)

Label
Kelvin Probe Force Microscopy : From Single Charge Detection to Device Characterization
Title
Kelvin Probe Force Microscopy
Title remainder
From Single Charge Detection to Device Characterization
Statement of responsibility
edited by Sascha Sadewasser, Thilo Glatzel
Contributor
Editor
Subject
Language
eng
Summary
This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular and atomic scale electrostatics. In the last 25 years, Kelvin probe force microscopy has developed from a specialized technique applied by a few scanning probe microscopy experts into a tool used by numerous research and development groups around the globe. This sequel to the editors’ previous volume zKelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces,y presents new and complementary topics. It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field
Member of
Cataloging source
AZU
Dewey number
502.8/2
Index
no index present
LC call number
QC718.5.S6
Literary form
non fiction
Nature of contents
dictionaries
http://library.link/vocab/relatedWorkOrContributorName
  • Sadewasser, Sascha.
  • Glatzel, Thilo.
Series statement
Springer Series in Surface Sciences,
Series volume
65
http://library.link/vocab/subjectName
  • Physics
  • Physical measurements
  • Measurement
  • Spectrum analysis
  • Microscopy
  • Nanotechnology
  • Materials science
  • Surfaces (Technology)
  • Thin films
Label
Kelvin Probe Force Microscopy : From Single Charge Detection to Device Characterization, edited by Sascha Sadewasser, Thilo Glatzel, (electronic book)
Instantiates
Publication
Antecedent source
mixed
Bibliography note
Includes bibliographical references and index
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
not applicable
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Contents
Part I: Technical aspects -- Experimental technique and working modes -- Dissipation KPFM -- KPFM techniques for liquid environment -- Open-loop and excitation KPFM -- Quantitative KPFM on semiconductor devices -- KPFM with atomic resolution.- KPFM with atomic resolution -- Part II: Theoretical Aspects -- Local dipoles in atomic and Kelvin probe force microscopy -- Influence of the tip electrostatic field on high resolution KPFM measurements -- Modelling the electrostatic field of a cantilever -- Theory of open-loop KPFM -- KPFM in a SPM simulator -- Electrostatic interactions with dielectric samples -- Part III: Applications -- Kelvin spectroscopy of single molecules -- KPFM for single molecule chemistry -- Optoelectronic properties of single molecules -- Quantitative KPFM of molecular self-assemblies -- Applications of KPFM in liquids -- KPFM of organic solar cell materials -- Correlation of optical and electrical nanoscale properties of organic devices -- KPFM for catalysis -- Quantitative electrical measurements of SiC devices
Control code
SPR1029075493
Dimensions
unknown
Extent
1 online resource (XXIV, 521 p. 234 illus., 194 illus. in color.)
File format
multiple file formats
Form of item
online
Isbn
9783319756875
Level of compression
uncompressed
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other control number
10.1007/978-3-319-75687-5
Other physical details
online resource.
Quality assurance targets
absent
Reformatting quality
access
Specific material designation
remote
System control number
  • on1029075493
  • (OCoLC)1029075493
Label
Kelvin Probe Force Microscopy : From Single Charge Detection to Device Characterization, edited by Sascha Sadewasser, Thilo Glatzel, (electronic book)
Publication
Antecedent source
mixed
Bibliography note
Includes bibliographical references and index
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
not applicable
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Contents
Part I: Technical aspects -- Experimental technique and working modes -- Dissipation KPFM -- KPFM techniques for liquid environment -- Open-loop and excitation KPFM -- Quantitative KPFM on semiconductor devices -- KPFM with atomic resolution.- KPFM with atomic resolution -- Part II: Theoretical Aspects -- Local dipoles in atomic and Kelvin probe force microscopy -- Influence of the tip electrostatic field on high resolution KPFM measurements -- Modelling the electrostatic field of a cantilever -- Theory of open-loop KPFM -- KPFM in a SPM simulator -- Electrostatic interactions with dielectric samples -- Part III: Applications -- Kelvin spectroscopy of single molecules -- KPFM for single molecule chemistry -- Optoelectronic properties of single molecules -- Quantitative KPFM of molecular self-assemblies -- Applications of KPFM in liquids -- KPFM of organic solar cell materials -- Correlation of optical and electrical nanoscale properties of organic devices -- KPFM for catalysis -- Quantitative electrical measurements of SiC devices
Control code
SPR1029075493
Dimensions
unknown
Extent
1 online resource (XXIV, 521 p. 234 illus., 194 illus. in color.)
File format
multiple file formats
Form of item
online
Isbn
9783319756875
Level of compression
uncompressed
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other control number
10.1007/978-3-319-75687-5
Other physical details
online resource.
Quality assurance targets
absent
Reformatting quality
access
Specific material designation
remote
System control number
  • on1029075493
  • (OCoLC)1029075493

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