The Resource Machine vision applications in industrial inspection XII : 21-22 January 2004, San Jose, California, USA, Jeffery R. Price, Fabrice Me+ѓriaudeau, chairs/editors ; sponsored ... by IS & T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering, (electronic book)

Machine vision applications in industrial inspection XII : 21-22 January 2004, San Jose, California, USA, Jeffery R. Price, Fabrice Me+ѓriaudeau, chairs/editors ; sponsored ... by IS & T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering, (electronic book)

Label
Machine vision applications in industrial inspection XII : 21-22 January 2004, San Jose, California, USA
Title
Machine vision applications in industrial inspection XII
Title remainder
21-22 January 2004, San Jose, California, USA
Statement of responsibility
Jeffery R. Price, Fabrice Me+ѓriaudeau, chairs/editors ; sponsored ... by IS & T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering
Title variation
  • Proceedings of electronic imaging science and technology
  • Electronic imaging science and technology
Contributor
Subject
Genre
Language
eng
Member of
Cataloging source
NHM
Illustrations
illustrations
Index
index present
Literary form
non fiction
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorDate
  • 1970-
  • 2004
http://library.link/vocab/relatedWorkOrContributorName
  • Price, Jeffery R.
  • Mériaudeau, Fabrice
  • IS & T--the Society for Imaging Science and Technology.
  • Society of Photo-optical Instrumentation Engineers
  • SPIE Digital Library
  • Electronic Imaging Science and Technology Symposium
Series statement
SPIE,
Series volume
5303
http://library.link/vocab/subjectName
  • Engineering inspection
  • Computer vision
  • Quality control
  • Mensuration
Label
Machine vision applications in industrial inspection XII : 21-22 January 2004, San Jose, California, USA, Jeffery R. Price, Fabrice Me+ѓriaudeau, chairs/editors ; sponsored ... by IS & T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering, (electronic book)
Instantiates
Publication
Bibliography note
Includes bibliographical references and index
Color
multicolored
Dimensions
28 cm.
Dimensions
unknown
Extent
vi, 204 p.
Form of item
electronic
Other physical details
ill.
Reproduction note
Electronic resource.
Specific material designation
remote
Label
Machine vision applications in industrial inspection XII : 21-22 January 2004, San Jose, California, USA, Jeffery R. Price, Fabrice Me+ѓriaudeau, chairs/editors ; sponsored ... by IS & T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering, (electronic book)
Publication
Bibliography note
Includes bibliographical references and index
Color
multicolored
Dimensions
28 cm.
Dimensions
unknown
Extent
vi, 204 p.
Form of item
electronic
Other physical details
ill.
Reproduction note
Electronic resource.
Specific material designation
remote

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