Coverart for item
The Resource Measurement technology and its application III : selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China, edited by Prasad Yarlagadda and Yun-Hae Kim, (electronic book ;)

Measurement technology and its application III : selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China, edited by Prasad Yarlagadda and Yun-Hae Kim, (electronic book ;)

Label
Measurement technology and its application III : selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China
Title
Measurement technology and its application III
Title remainder
selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China
Statement of responsibility
edited by Prasad Yarlagadda and Yun-Hae Kim
Title variation
ICMIA 2014
Creator
Contributor
Editor
Subject
Genre
Language
eng
Member of
Cataloging source
MiAaPQ
Dewey number
681.2
Illustrations
illustrations
Index
index present
LC call number
TA165
LC item number
.I584 2014
Literary form
non fiction
http://bibfra.me/vocab/lite/meetingDate
2014
http://bibfra.me/vocab/lite/meetingName
International Conference on Measurement, Instrumentation and Automation
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorName
  • Yarlagadda, Prasad
  • Kim, Yun-Hae
Series statement
Applied Mechanics and Materials
Series volume
568-570
http://library.link/vocab/subjectName
  • Detectors
  • Measurement
  • Measuring instruments
Label
Measurement technology and its application III : selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China, edited by Prasad Yarlagadda and Yun-Hae Kim, (electronic book ;)
Instantiates
Publication
Copyright
Bibliography note
Includes bibliographical references at the end of each chapters and indexes
Carrier category
online resource
Carrier MARC source
rdacarrier
Color
multicolored
Content category
text
Content type MARC source
rdacontent
Control code
EBC1910833
Dimensions
unknown
Extent
1 online resource (2012 pages)
Form of item
online
Isbn
9783038351382
Media category
computer
Media MARC source
rdamedia
Other physical details
illustrations (some color), graphs, tables.
Reproduction note
Electronic resource.
Sound
unknown sound
Specific material designation
remote
Label
Measurement technology and its application III : selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China, edited by Prasad Yarlagadda and Yun-Hae Kim, (electronic book ;)
Publication
Copyright
Bibliography note
Includes bibliographical references at the end of each chapters and indexes
Carrier category
online resource
Carrier MARC source
rdacarrier
Color
multicolored
Content category
text
Content type MARC source
rdacontent
Control code
EBC1910833
Dimensions
unknown
Extent
1 online resource (2012 pages)
Form of item
online
Isbn
9783038351382
Media category
computer
Media MARC source
rdamedia
Other physical details
illustrations (some color), graphs, tables.
Reproduction note
Electronic resource.
Sound
unknown sound
Specific material designation
remote

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