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The Resource Methods of surface analysis: techniques and applications

Methods of surface analysis: techniques and applications

Label
Methods of surface analysis: techniques and applications
Title
Methods of surface analysis: techniques and applications
Contributor
Subject
Language
eng
Summary
This introduction to the major techniques of surface analysis, written by specialists in the field with practical experience, includes the ways in which these techniques can be used to solve problems on surfaces, interfaces, thin films and surface coatings
Cataloging source
UkLiU
Index
no index present
LC call number
TP156.S95
LC item number
M48 1989
Literary form
non fiction
http://library.link/vocab/relatedWorkOrContributorName
Walls, J. M
http://library.link/vocab/subjectName
  • Surfaces (Physics)
  • Spectrum analysis
Label
Methods of surface analysis: techniques and applications
Instantiates
Publication
Bibliography note
Includes bibliographical references and index
Carrier category
volume
Carrier category code
  • nc
Carrier MARC source
rdacarrier
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Contents
Methods of surface analysis / J.M. Walls -- Ion erosion in surface analysis / R. Smith and J.M. Walls -- Electron and ion energy analysis / M.P. Seah -- Auger electron spectroscopy / H.E. Bishop -- X-ray photoelectron spectroscopy / A.B. Christie -- Static secondary ion mass spectroscopy / J.C. Vickerman -- Dynamic secondary ion mass spectrometry / D.E. Sykes -- Ion scattering spectroscopy / D.G. Armour -- Rutherford back-scattering spectrometry / W.A. Grant
Dimensions
24 cm
Extent
x, 342 pages
Isbn
9780521305648
Media category
unmediated
Media MARC source
rdamedia
Media type code
  • n
Other physical details
illustrations
Label
Methods of surface analysis: techniques and applications
Publication
Bibliography note
Includes bibliographical references and index
Carrier category
volume
Carrier category code
  • nc
Carrier MARC source
rdacarrier
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Contents
Methods of surface analysis / J.M. Walls -- Ion erosion in surface analysis / R. Smith and J.M. Walls -- Electron and ion energy analysis / M.P. Seah -- Auger electron spectroscopy / H.E. Bishop -- X-ray photoelectron spectroscopy / A.B. Christie -- Static secondary ion mass spectroscopy / J.C. Vickerman -- Dynamic secondary ion mass spectrometry / D.E. Sykes -- Ion scattering spectroscopy / D.G. Armour -- Rutherford back-scattering spectrometry / W.A. Grant
Dimensions
24 cm
Extent
x, 342 pages
Isbn
9780521305648
Media category
unmediated
Media MARC source
rdamedia
Media type code
  • n
Other physical details
illustrations
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