Coverart for item
The Resource Metrics for high-quality specular surfaces, Lionel R. Baker, (electronic book)

Metrics for high-quality specular surfaces, Lionel R. Baker, (electronic book)

Label
Metrics for high-quality specular surfaces
Title
Metrics for high-quality specular surfaces
Statement of responsibility
Lionel R. Baker
Creator
Contributor
Subject
Language
eng
Summary
This book supplies the optical component and systems designer, and quality assurance engineers and managers with the definitions, measurement principles, and standard metrics used to characterize high-quality specular surfaces. The author covers both the traditional visual methods as well as newer (but not necessarily better) computer-aided techniques and describes the metrics adopted by the new ISO standards, including the setting of form and finish tolerances. Key issues of industry are raised, to help stimulate research and development of new methods and standards that blend the best of the old and new approaches to surface assessment
Member of
Additional physical form
Also available in print version.
Cataloging source
CaBNvSL
http://library.link/vocab/creatorName
Baker, L. R.
Dewey number
681/.428
Illustrations
illustrations
Index
index present
LC call number
TA418.7
LC item number
.B35 2004e
Literary form
non fiction
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorName
Society of Photo-optical Instrumentation Engineers
Series statement
Tutorial texts in optical engineering
Series volume
TT65
http://library.link/vocab/subjectName
  • Surfaces (Technology)
  • Optical measurements
  • Optical instruments
Target audience
  • adult
  • specialized
Label
Metrics for high-quality specular surfaces, Lionel R. Baker, (electronic book)
Instantiates
Publication
Note
  • "SPIE digital library."
  • Title from PDF t.p. (viewed on August 22, 2009)
Bibliography note
Includes bibliographical references and index
Color
black and white
Contents
  • Preface -- List of Abbreviations-- List of Symbols --
  • Chapter 1 Surface Metrics, 1.1 Introduction ; 1.2 Why Measure Surfaces? 1.2.1 System function. 1.2.2 Appearance. 1.2.3 Manufacturing efficiency. 1.2.4 Benefits ; 1.3 Definition of Surface Metrics. 1.3.1 Surface metrics influencing quality. 1.3.2 Causes of defects in surface topography ; 1.4 Chapter Conclusions ; References --
  • Chapter 2 Surface Form, 2.1 Introduction ; 2.2 Optical Height Probes ; 2.3 Optical Slope Probe ; 2.4 Interferometers. 2.4.1 Twyman-Green interferometer. 2.4.2 Laser Fizeau interferometer. 2.4.3 Four-step measurement of phase. 2.4.4 Interlaboratory comparison of interferometers. 2.4.5 Interferometer error sources and calibration; 2.5 Form Tolerances. 2.5.1 Approximating a spherical surface. 2.5.2 Sagitta error. 2.5.3 Irregularity function. 2.5.4 Irregularity. 2.5.5 Approximating an aspheric surface. 2.5.6 Rotationally symmetric irregularity. 2.5.7 Total RMS deviation (RMSt). 2.5.8 RMS irregularity (RMSi). 2.5.9 RMS asymmetry (RMSa.) 2.5.10 Form indication on drawings ; 2.6 Chapter Conclusions ; References --
  • Chapter 3 Surface Roughness, 3.1 Introduction ; 3.2 Typical Optical Component Roughness Values ; 3.3 Deterministic Methods. 3.3.1 Stylus method. 3.3.2 Profilometry metrics. 3.3.3 Microinterferometer ; 3.4 Parametric Methods. 3.4.1 Surface point spread functions. 3.4.2 Total integrated scatter measurement ; 3.5 Surface Roughness Indications in Drawings ; 3.6 Chapter Conclusions ; References -- Chapter 4 SurfaceWaviness, 4.1 Introduction ; 4.2 Fourier Analysis of Height Profile ; 4.3 Spatial Frequency Zones ; 4.4 Computation of Texture ; 4.5 Chapter Conclusions ; References --
  • Chapter 5 Surface Imperfections, 5.1 Introduction ; 5.2 Imperfections and Subconscious Thoughts ; 5.3 Effect of Surface Imperfections ; 5.4 Impact of Imperfections on Market Access ; 5.5 Description of Imperfections. 5.5.1 Terminology. 5.5.2 Size of imperfections. 5.5.3 Substrates/materials. 5.5.4 Location. 5.5.5 Characteristics; 5.6 Influence of Imperfections on Quality. 5.6.1 Cosmetic influence. 5.6.2 Functional influence ; 5.7 Causes of Imperfections ; 5.8 Reduction of Damage ; 5.9 Imperfection Measurement. 5.9.1 Why measure imperfections? 5.9.2 Characterization and measurement of imperfections ; 5.10 Comparison of Measurement Methods ; 5.11 Imperfection Size Versus Visibility. 5.11.1 Surface step as an imperfection. 5.11.2 Step measurement by interferometry ; 5.12 The Eye as a Sensor. 5.12.1 Benefits. 5.12.2 Disbenefits ; 5.13 Disbenefits of Inspection ; 5.14 National Standards for Scratch Assessment. 5.14.1 United States. 5.14.2 Germany. 5.14.3 France. 5.14.4 United Kingdom ; 5.15 Level of Agreement Achieved Using National Standards ; 5.16 Scratch Reference Standards ; 5.17 Target Specification for Imperfection Measurement ; 5.18 Need for Standards ; 5.19 ISO TC 172 Optics and Optical Instruments ; 5.20 Comparison of Two Methods Proposed by ISO in 1996. 20.1 Method I. 5.20.2 Method II. 5.20.3 Comparison of Methods I and II ; 5.21 Chapter Conclusions ; References --
  • Chapter 6 Measurement of Imperfections by Obscuration, 6.1 Introduction ; 6.2 Optical Component Inspection ; 6.3 Radiometric Obscuration by Imperfections ; 6.4 Calibration Graticules ; 6.5 LEW and SED Measurement Requirements ; 6.6 LEW and SED Simple Viewing System ; 6.7 Analogue Microscope Image Comparator (AMIC). 6.7.1 Description. 6.7.2 Theory. 6.7.3 Method of operation ; 6.8 Digital Microscope Image Comparator (DMIC. 6.8.1 Description. 6.8.2 Results and discussion ; 6.9 Chapter Conclusions ; References --
  • Chapter 7 Surface Imperfection Quality Control, 7.1 Introduction ; 7.2 Survey of Tolerances. 7.2.1 British Standard BS4301 (1991). 7.2.2 American Standard MIL-O-13830A:1963. 7.2.3 German Standard DIN 3140: Part 7, 1978. 7.2.4 French Standard ; 7.3 Acceptable Thresholds for Scratches and Roughness ; 7.4 Inspection and Measurement Flow Diagram ; 7.5 Chapter Conclusions ; References --
  • Chapter 8 Far-Field Nanoscopy, 8.1 Introduction ; 8.2 Comparison between Subjective and Objective Measurements of Imperfections ; 8.3 Relative Contrast of Standard Scratches ; 8.4 Measurement of Imperfections and Contamination in Assemblies ; 8.5 Measurement of Imperfections in Coatings ; 8.6 Use of MIC to Measure Surface Texture ; 8.7 Use of MIC to Examine Phase Objects ; 8.8 Use of MIC in AC Mode ; 8.9 Use of MIC On-Machine ; 8.10 Chapter Conclusions ; References --
  • Chapter 9 Strip Product Inspection, 9.1 Introduction ; 9.2 Laser Beam Scanners ; 9.3 Camera Inspection Systems ; 9.4 Chapter Conclusions ; Acknowledgment ; References -- Appendix 1. Quality Metrics for Digital Cameras -- Appendix 2. Surface Cleaning -- Glossary -- Contacts and Further Reading -- Index
Dimensions
unknown
Extent
1 online resource (xiv, 151 p. : ill.)
File format
multiple file formats
Form of item
electronic
Isbn
9780819478696
Other physical details
digital file.
Reformatting quality
access
Reproduction note
Electronic resource.
Specific material designation
remote
System details
System requirements: Adobe Acrobat Reader
Label
Metrics for high-quality specular surfaces, Lionel R. Baker, (electronic book)
Publication
Note
  • "SPIE digital library."
  • Title from PDF t.p. (viewed on August 22, 2009)
Bibliography note
Includes bibliographical references and index
Color
black and white
Contents
  • Preface -- List of Abbreviations-- List of Symbols --
  • Chapter 1 Surface Metrics, 1.1 Introduction ; 1.2 Why Measure Surfaces? 1.2.1 System function. 1.2.2 Appearance. 1.2.3 Manufacturing efficiency. 1.2.4 Benefits ; 1.3 Definition of Surface Metrics. 1.3.1 Surface metrics influencing quality. 1.3.2 Causes of defects in surface topography ; 1.4 Chapter Conclusions ; References --
  • Chapter 2 Surface Form, 2.1 Introduction ; 2.2 Optical Height Probes ; 2.3 Optical Slope Probe ; 2.4 Interferometers. 2.4.1 Twyman-Green interferometer. 2.4.2 Laser Fizeau interferometer. 2.4.3 Four-step measurement of phase. 2.4.4 Interlaboratory comparison of interferometers. 2.4.5 Interferometer error sources and calibration; 2.5 Form Tolerances. 2.5.1 Approximating a spherical surface. 2.5.2 Sagitta error. 2.5.3 Irregularity function. 2.5.4 Irregularity. 2.5.5 Approximating an aspheric surface. 2.5.6 Rotationally symmetric irregularity. 2.5.7 Total RMS deviation (RMSt). 2.5.8 RMS irregularity (RMSi). 2.5.9 RMS asymmetry (RMSa.) 2.5.10 Form indication on drawings ; 2.6 Chapter Conclusions ; References --
  • Chapter 3 Surface Roughness, 3.1 Introduction ; 3.2 Typical Optical Component Roughness Values ; 3.3 Deterministic Methods. 3.3.1 Stylus method. 3.3.2 Profilometry metrics. 3.3.3 Microinterferometer ; 3.4 Parametric Methods. 3.4.1 Surface point spread functions. 3.4.2 Total integrated scatter measurement ; 3.5 Surface Roughness Indications in Drawings ; 3.6 Chapter Conclusions ; References -- Chapter 4 SurfaceWaviness, 4.1 Introduction ; 4.2 Fourier Analysis of Height Profile ; 4.3 Spatial Frequency Zones ; 4.4 Computation of Texture ; 4.5 Chapter Conclusions ; References --
  • Chapter 5 Surface Imperfections, 5.1 Introduction ; 5.2 Imperfections and Subconscious Thoughts ; 5.3 Effect of Surface Imperfections ; 5.4 Impact of Imperfections on Market Access ; 5.5 Description of Imperfections. 5.5.1 Terminology. 5.5.2 Size of imperfections. 5.5.3 Substrates/materials. 5.5.4 Location. 5.5.5 Characteristics; 5.6 Influence of Imperfections on Quality. 5.6.1 Cosmetic influence. 5.6.2 Functional influence ; 5.7 Causes of Imperfections ; 5.8 Reduction of Damage ; 5.9 Imperfection Measurement. 5.9.1 Why measure imperfections? 5.9.2 Characterization and measurement of imperfections ; 5.10 Comparison of Measurement Methods ; 5.11 Imperfection Size Versus Visibility. 5.11.1 Surface step as an imperfection. 5.11.2 Step measurement by interferometry ; 5.12 The Eye as a Sensor. 5.12.1 Benefits. 5.12.2 Disbenefits ; 5.13 Disbenefits of Inspection ; 5.14 National Standards for Scratch Assessment. 5.14.1 United States. 5.14.2 Germany. 5.14.3 France. 5.14.4 United Kingdom ; 5.15 Level of Agreement Achieved Using National Standards ; 5.16 Scratch Reference Standards ; 5.17 Target Specification for Imperfection Measurement ; 5.18 Need for Standards ; 5.19 ISO TC 172 Optics and Optical Instruments ; 5.20 Comparison of Two Methods Proposed by ISO in 1996. 20.1 Method I. 5.20.2 Method II. 5.20.3 Comparison of Methods I and II ; 5.21 Chapter Conclusions ; References --
  • Chapter 6 Measurement of Imperfections by Obscuration, 6.1 Introduction ; 6.2 Optical Component Inspection ; 6.3 Radiometric Obscuration by Imperfections ; 6.4 Calibration Graticules ; 6.5 LEW and SED Measurement Requirements ; 6.6 LEW and SED Simple Viewing System ; 6.7 Analogue Microscope Image Comparator (AMIC). 6.7.1 Description. 6.7.2 Theory. 6.7.3 Method of operation ; 6.8 Digital Microscope Image Comparator (DMIC. 6.8.1 Description. 6.8.2 Results and discussion ; 6.9 Chapter Conclusions ; References --
  • Chapter 7 Surface Imperfection Quality Control, 7.1 Introduction ; 7.2 Survey of Tolerances. 7.2.1 British Standard BS4301 (1991). 7.2.2 American Standard MIL-O-13830A:1963. 7.2.3 German Standard DIN 3140: Part 7, 1978. 7.2.4 French Standard ; 7.3 Acceptable Thresholds for Scratches and Roughness ; 7.4 Inspection and Measurement Flow Diagram ; 7.5 Chapter Conclusions ; References --
  • Chapter 8 Far-Field Nanoscopy, 8.1 Introduction ; 8.2 Comparison between Subjective and Objective Measurements of Imperfections ; 8.3 Relative Contrast of Standard Scratches ; 8.4 Measurement of Imperfections and Contamination in Assemblies ; 8.5 Measurement of Imperfections in Coatings ; 8.6 Use of MIC to Measure Surface Texture ; 8.7 Use of MIC to Examine Phase Objects ; 8.8 Use of MIC in AC Mode ; 8.9 Use of MIC On-Machine ; 8.10 Chapter Conclusions ; References --
  • Chapter 9 Strip Product Inspection, 9.1 Introduction ; 9.2 Laser Beam Scanners ; 9.3 Camera Inspection Systems ; 9.4 Chapter Conclusions ; Acknowledgment ; References -- Appendix 1. Quality Metrics for Digital Cameras -- Appendix 2. Surface Cleaning -- Glossary -- Contacts and Further Reading -- Index
Dimensions
unknown
Extent
1 online resource (xiv, 151 p. : ill.)
File format
multiple file formats
Form of item
electronic
Isbn
9780819478696
Other physical details
digital file.
Reformatting quality
access
Reproduction note
Electronic resource.
Specific material designation
remote
System details
System requirements: Adobe Acrobat Reader

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