The Resource Microelectronic manufacturing yield, reliability, and failure analysis III : 1-2 October, 1997, Austin, Texas, Ali Keshavarzi, Sharad Prasad, Hans-Dieter Hartmann, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering ; cooperating organizations, SEMI--Semiconductor Equipment and Materials International, Solid State Technology, [and] the Electrochemical Society, (electronic book)

Microelectronic manufacturing yield, reliability, and failure analysis III : 1-2 October, 1997, Austin, Texas, Ali Keshavarzi, Sharad Prasad, Hans-Dieter Hartmann, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering ; cooperating organizations, SEMI--Semiconductor Equipment and Materials International, Solid State Technology, [and] the Electrochemical Society, (electronic book)

Label
Microelectronic manufacturing yield, reliability, and failure analysis III : 1-2 October, 1997, Austin, Texas
Title
Microelectronic manufacturing yield, reliability, and failure analysis III
Title remainder
1-2 October, 1997, Austin, Texas
Statement of responsibility
Ali Keshavarzi, Sharad Prasad, Hans-Dieter Hartmann, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering ; cooperating organizations, SEMI--Semiconductor Equipment and Materials International, Solid State Technology, [and] the Electrochemical Society
Contributor
Subject
Genre
Language
eng
Member of
Cataloging source
SPIED
Dewey number
621.381
Illustrations
illustrations
Index
index present
LC call number
TK7874
LC item number
.M458 1997
Literary form
non fiction
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorName
  • Ali Keshavarzi
  • Prasad, Sharad
  • Hartmann, Hans-Dieter
  • Society of Photo-optical Instrumentation Engineers
  • SPIE Digital Library
Series statement
SPIE proceedings series,
Series volume
3216
http://library.link/vocab/subjectName
  • Microelectronics
  • Integrated circuits
Label
Microelectronic manufacturing yield, reliability, and failure analysis III : 1-2 October, 1997, Austin, Texas, Ali Keshavarzi, Sharad Prasad, Hans-Dieter Hartmann, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering ; cooperating organizations, SEMI--Semiconductor Equipment and Materials International, Solid State Technology, [and] the Electrochemical Society, (electronic book)
Instantiates
Publication
Bibliography note
Includes bibliographical references and index
Dimensions
28 cm.
Dimensions
unknown
Extent
viii, 198 p.
Form of item
electronic
Other physical details
ill.
Reproduction note
Electronic resource.
Specific material designation
remote
Label
Microelectronic manufacturing yield, reliability, and failure analysis III : 1-2 October, 1997, Austin, Texas, Ali Keshavarzi, Sharad Prasad, Hans-Dieter Hartmann, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering ; cooperating organizations, SEMI--Semiconductor Equipment and Materials International, Solid State Technology, [and] the Electrochemical Society, (electronic book)
Publication
Bibliography note
Includes bibliographical references and index
Dimensions
28 cm.
Dimensions
unknown
Extent
viii, 198 p.
Form of item
electronic
Other physical details
ill.
Reproduction note
Electronic resource.
Specific material designation
remote

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