The Resource Microelectronic yield, reliability, and advanced packaging : 28-30 November 2000, Singapore, Cher Ming Tan ... [et al.], chairs/editors ; sponsored by Nanyang Technological University (Singapore) [and] SPIE--the International Society for Optical Engineering ; cooperating organizations, Institute of Physics (Singapore) ... [et al.], (electronic book)

Microelectronic yield, reliability, and advanced packaging : 28-30 November 2000, Singapore, Cher Ming Tan ... [et al.], chairs/editors ; sponsored by Nanyang Technological University (Singapore) [and] SPIE--the International Society for Optical Engineering ; cooperating organizations, Institute of Physics (Singapore) ... [et al.], (electronic book)

Label
Microelectronic yield, reliability, and advanced packaging : 28-30 November 2000, Singapore
Title
Microelectronic yield, reliability, and advanced packaging
Title remainder
28-30 November 2000, Singapore
Statement of responsibility
Cher Ming Tan ... [et al.], chairs/editors ; sponsored by Nanyang Technological University (Singapore) [and] SPIE--the International Society for Optical Engineering ; cooperating organizations, Institute of Physics (Singapore) ... [et al.]
Contributor
Subject
Genre
Language
eng
Member of
Cataloging source
SPIED
Illustrations
illustrations
Index
index present
Literary form
non fiction
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorDate
1959-
http://library.link/vocab/relatedWorkOrContributorName
  • Tan, Cher Ming
  • Society of Photo-optical Instrumentation Engineers
  • Nanyang Technological University
  • Institute of Physics, Singapore
  • SPIE Digital Library
Series statement
SPIE proceedings series
Series volume
4229
http://library.link/vocab/subjectName
  • Microelectromechanical systems
  • Microelectronic packaging
Label
Microelectronic yield, reliability, and advanced packaging : 28-30 November 2000, Singapore, Cher Ming Tan ... [et al.], chairs/editors ; sponsored by Nanyang Technological University (Singapore) [and] SPIE--the International Society for Optical Engineering ; cooperating organizations, Institute of Physics (Singapore) ... [et al.], (electronic book)
Instantiates
Publication
Bibliography note
Includes bibliographical references and index
Carrier category
online resource
Carrier category code
  • cr
Carrier MARC source
rdacarrier
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Dimensions
28 cm.
Dimensions
unknown
Extent
xvii, 222 p.
Form of item
electronic
Media category
computer
Media MARC source
rdamedia
Media type code
  • c
Other physical details
ill.
Reproduction note
Electronic resource.
Specific material designation
remote
Label
Microelectronic yield, reliability, and advanced packaging : 28-30 November 2000, Singapore, Cher Ming Tan ... [et al.], chairs/editors ; sponsored by Nanyang Technological University (Singapore) [and] SPIE--the International Society for Optical Engineering ; cooperating organizations, Institute of Physics (Singapore) ... [et al.], (electronic book)
Publication
Bibliography note
Includes bibliographical references and index
Carrier category
online resource
Carrier category code
  • cr
Carrier MARC source
rdacarrier
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Dimensions
28 cm.
Dimensions
unknown
Extent
xvii, 222 p.
Form of item
electronic
Media category
computer
Media MARC source
rdamedia
Media type code
  • c
Other physical details
ill.
Reproduction note
Electronic resource.
Specific material designation
remote

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