Coverart for item
The Resource NDCS 2008 : IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems : 29-30 September 2008, Cambridge, Massachusetts, sponsored by IEEE Computer Society, IEEE Test Technology Technical Council

NDCS 2008 : IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems : 29-30 September 2008, Cambridge, Massachusetts, sponsored by IEEE Computer Society, IEEE Test Technology Technical Council

Label
NDCS 2008 : IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems : 29-30 September 2008, Cambridge, Massachusetts
Title
NDCS 2008
Title remainder
IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems : 29-30 September 2008, Cambridge, Massachusetts
Statement of responsibility
sponsored by IEEE Computer Society, IEEE Test Technology Technical Council
Title variation
  • IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems
  • Design and Test of Nano Devices, Circuits and Systems, 2008 IEEE International Workshop on
Creator
Contributor
Subject
Genre
Language
eng
Member of
Cataloging source
UAB
Dewey number
621.381
Illustrations
illustrations
Index
index present
LC call number
TA418.9.N35
Literary form
non fiction
http://bibfra.me/vocab/lite/meetingDate
2008
http://bibfra.me/vocab/lite/meetingName
IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorName
IEEE Computer Society
http://library.link/vocab/subjectName
  • Nanoelectromechanical systems
  • Nanoelectromechanical systems
  • Nanostructured materials
  • Ebooks
Label
NDCS 2008 : IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems : 29-30 September 2008, Cambridge, Massachusetts, sponsored by IEEE Computer Society, IEEE Test Technology Technical Council
Instantiates
Publication
Note
IEEE Computer Society Order Number P3379
Antecedent source
unknown
Bibliography note
Includes bibliographical references and author index
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
IEEE263431182
Dimensions
unknown
Extent
1 online resource (x, 85 pages)
File format
unknown
Form of item
online
Level of compression
unknown
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations
Quality assurance targets
not applicable
Reformatting quality
unknown
Sound
unknown sound
Specific material designation
remote
System control number
  • ocn263431182
  • (OCoLC)263431182
Label
NDCS 2008 : IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems : 29-30 September 2008, Cambridge, Massachusetts, sponsored by IEEE Computer Society, IEEE Test Technology Technical Council
Publication
Note
IEEE Computer Society Order Number P3379
Antecedent source
unknown
Bibliography note
Includes bibliographical references and author index
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
IEEE263431182
Dimensions
unknown
Extent
1 online resource (x, 85 pages)
File format
unknown
Form of item
online
Level of compression
unknown
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations
Quality assurance targets
not applicable
Reformatting quality
unknown
Sound
unknown sound
Specific material designation
remote
System control number
  • ocn263431182
  • (OCoLC)263431182

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