Coverart for item
The Resource Nanometer technology designs : high-quality delay tests, Mohammad Tehranipoor, Nisar Ahmed, (electronic book)

Nanometer technology designs : high-quality delay tests, Mohammad Tehranipoor, Nisar Ahmed, (electronic book)

Label
Nanometer technology designs : high-quality delay tests
Title
Nanometer technology designs
Title remainder
high-quality delay tests
Statement of responsibility
Mohammad Tehranipoor, Nisar Ahmed
Creator
Contributor
Subject
Language
eng
Cataloging source
CUS
http://library.link/vocab/creatorDate
1974-
http://library.link/vocab/creatorName
Tehranipoor, Mohammad H.
Dewey number
621.381548
Illustrations
illustrations
Index
index present
LC call number
TK7874
Literary form
non fiction
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorName
Ahmed, Nisar
http://library.link/vocab/subjectName
  • Integrated circuits
  • Integrated circuits
  • Nanotechnology
Label
Nanometer technology designs : high-quality delay tests, Mohammad Tehranipoor, Nisar Ahmed, (electronic book)
Instantiates
Publication
Note
Description based on print version record
Bibliography note
Includes bibliographical references and index
Control code
SPR535319542
Extent
1 online resource (xvii, 281 p.)
Form of item
online
Isbn
9780387764863
Other physical details
ill.
Specific material designation
remote
Label
Nanometer technology designs : high-quality delay tests, Mohammad Tehranipoor, Nisar Ahmed, (electronic book)
Publication
Note
Description based on print version record
Bibliography note
Includes bibliographical references and index
Control code
SPR535319542
Extent
1 online resource (xvii, 281 p.)
Form of item
online
Isbn
9780387764863
Other physical details
ill.
Specific material designation
remote

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