Coverart for item
The Resource Next generation HALT and HASS : robust design of electronics and systems, Kirk Gray, John James Paschkewitz, (electronic book ;)

Next generation HALT and HASS : robust design of electronics and systems, Kirk Gray, John James Paschkewitz, (electronic book ;)

Label
Next generation HALT and HASS : robust design of electronics and systems
Title
Next generation HALT and HASS
Title remainder
robust design of electronics and systems
Statement of responsibility
Kirk Gray, John James Paschkewitz
Creator
Contributor
Author
Subject
Language
eng
Member of
Cataloging source
MiAaPQ
http://library.link/vocab/creatorName
Gray, Kirk
Dewey number
621.381028/7
Illustrations
  • illustrations
  • charts
Index
index present
LC call number
TA169.3
LC item number
.G73 2016
Literary form
non fiction
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorName
Paschkewitz, John James
Series statement
Wiley series in quality and reliability engineering
http://library.link/vocab/subjectName
  • Accelerated life testing
  • Electronic systems
  • Electronic systems
Label
Next generation HALT and HASS : robust design of electronics and systems, Kirk Gray, John James Paschkewitz, (electronic book ;)
Instantiates
Publication
Bibliography note
Includes bibliographical references and index
Carrier category
online resource
Carrier MARC source
rdacarrier
Color
multicolored
Content category
text
Content type MARC source
rdacontent
Contents
Basis and limitations of typical current reliability methods & metrics -- The need for reliability assurance metrics to change -- Challenges to advancing electronics reliability engineering -- A new deterministic reliability development paradigm -- Common understanding of HALT approach is critical for success -- The fundamentals of HALT -- Highly accelerated stress screening (HALT) and audits (HASA) -- HALT benefits for software/firmware performance and reliability -- Quantitative accelerated life test -- Failure analysis and corrective action -- Additional applications of HALT methods
Control code
EBC4451897
Dimensions
unknown
Extent
1 online resource (299 pages)
Form of item
online
Isbn
9781118700228
Media category
computer
Media MARC source
rdamedia
Other physical details
illustrations (some color)
Reproduction note
Electronic resource.
Sound
unknown sound
Specific material designation
remote
Label
Next generation HALT and HASS : robust design of electronics and systems, Kirk Gray, John James Paschkewitz, (electronic book ;)
Publication
Bibliography note
Includes bibliographical references and index
Carrier category
online resource
Carrier MARC source
rdacarrier
Color
multicolored
Content category
text
Content type MARC source
rdacontent
Contents
Basis and limitations of typical current reliability methods & metrics -- The need for reliability assurance metrics to change -- Challenges to advancing electronics reliability engineering -- A new deterministic reliability development paradigm -- Common understanding of HALT approach is critical for success -- The fundamentals of HALT -- Highly accelerated stress screening (HALT) and audits (HASA) -- HALT benefits for software/firmware performance and reliability -- Quantitative accelerated life test -- Failure analysis and corrective action -- Additional applications of HALT methods
Control code
EBC4451897
Dimensions
unknown
Extent
1 online resource (299 pages)
Form of item
online
Isbn
9781118700228
Media category
computer
Media MARC source
rdamedia
Other physical details
illustrations (some color)
Reproduction note
Electronic resource.
Sound
unknown sound
Specific material designation
remote

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