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The Resource Noncontact atomic force microscopy, S. Morita, R. Wiesendanger, E. Meyer, (eds.)

Noncontact atomic force microscopy, S. Morita, R. Wiesendanger, E. Meyer, (eds.)

Label
Noncontact atomic force microscopy
Title
Noncontact atomic force microscopy
Statement of responsibility
S. Morita, R. Wiesendanger, E. Meyer, (eds.)
Contributor
Subject
Language
eng
Cataloging source
DLC
Illustrations
illustrations
Index
index present
Literary form
non fiction
http://library.link/vocab/relatedWorkOrContributorDate
  • 1948-
  • 1961-
http://library.link/vocab/relatedWorkOrContributorName
  • Morita, S.
  • Wiesendanger, R.
  • Meyer, E.
Series statement
Nanoscience and technology
http://library.link/vocab/subjectName
Atomic force microscopy
Label
Noncontact atomic force microscopy, S. Morita, R. Wiesendanger, E. Meyer, (eds.)
Instantiates
Publication
Bibliography note
Includes bibliographical references and index
Carrier category
volume
Carrier category code
  • nc
Carrier MARC source
rdacarrier
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Contents
  • 1.
  • Introduction/
  • Seizo Morita
  • p. 1
  • 2.
  • Principle of NC-AFM/
  • Franz J. Giessibl
  • p. 11
  • 3.
  • Semiconductor Surfaces/
  • Seizo Morita
  • Yasuhiro Sugawara
  • p. 47
  • 4.
  • Bias Dependence of NC-AFM Images and Tunneling Current Variations on Semiconductor Surfaces/
  • Toyoko Arai
  • Masahiko Tomitori
  • p. 79
  • p. 93
  • 5.
  • Alkali Halides/
  • Roland Bennewitz
  • Martin Bammerlin
  • Ernst Meyer
  • 6.
  • Atomic Resolution Imaging on Fluorides/
  • Michael Reichling
  • Clemens Barth
  • p. 109
  • Koichi Mukasa
  • p. 125
  • 7.
  • Atomically Resolved Imaging of a NiO(001) Surface/
  • Hirotaka Hosoi
  • Kazuhisa Sueoka
  • Kazunobu Hayakawa
  • 8.
  • Atomic Structure, Order and Disorder on High Temperature Reconstructed [alpha]-Al[subscript 2]O[subscript 3](0001)/
  • Clemens Barth
  • Michael Reichling
  • p. 135
  • 9.
  • NC-AFM Imaging of Surface Reconstructions and Metal Growth on Oxides/
  • Chi Lun Pang
  • Geoff Thornton
  • p. 147
  • 10.
  • Atoms and Molecules on TiO[subscript 2](110) and CeO[subscript 2](111) Surfaces/
  • Ken-ichi Fukui
  • Yasuhiro Iwasawa
  • p. 167
  • 11.
  • NC-AFM Imaging of Adsorbed Molecules/
  • Yasuhiro Sugawara
  • p. 183
  • 12.
  • Organic Molecular Films/
  • Hirofumi Yamada
  • p. 193
  • 13.
  • Single-Molecule Analysis/
  • Akira Sasahara
  • Hiroshi Onishi
  • p. 215
  • p. 233
  • 14.
  • Low-Temperature Measurements: Principles, Instrumentation, and Application/
  • Wolf Allers
  • Alexander Schwarz
  • Udo D. Schwarz
  • Katsunori Tagami
  • Satoshi Watanabe
  • p. 257
  • 15.
  • Theory of Non-Contact Atomic Force Microscopy/
  • Masaru Tsukada
  • Naruo Sasaki
  • Michel Gauthier
  • Ruben Perez
  • Ivan Stich
  • p. 279
  • 16.
  • Chemical Interaction in NC-AFM on Semiconductor Surfaces/
  • San-Huang Ke
  • Tsuyoshi Uda
  • Kiyoyuki Terakura
  • Michael Reichling
  • p. 305
  • 17.
  • Contrast Mechanisms on Insulating Surfaces/
  • Adam Foster
  • Alexander Shluger
  • Clemens Barth
  • 18.
  • Analysis of Microscopy and Spectroscopy Experiments/
  • Hendrik Holscher
  • p. 349
  • p. 371
  • 19.
  • Theory of Energy Dissipation into Surface Vibrations/
  • Michel Gauthier
  • Lev Kantorovich
  • Masaru Tsukada
  • 20.
  • Measurement of Dissipation Induced by Tip - Sample Interactions/
  • H. J. Hug
  • A. Baratoff
  • p. 395
  • Index.
  • p. 433
Control code
l82002021665
Dimensions
25 cm.
Extent
xviii, 439 p
Isbn
9783540431176
Lccn
2002021665
Media category
unmediated
Media MARC source
rdamedia
Media type code
  • n
Other physical details
ill
Label
Noncontact atomic force microscopy, S. Morita, R. Wiesendanger, E. Meyer, (eds.)
Publication
Bibliography note
Includes bibliographical references and index
Carrier category
volume
Carrier category code
  • nc
Carrier MARC source
rdacarrier
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Contents
  • 1.
  • Introduction/
  • Seizo Morita
  • p. 1
  • 2.
  • Principle of NC-AFM/
  • Franz J. Giessibl
  • p. 11
  • 3.
  • Semiconductor Surfaces/
  • Seizo Morita
  • Yasuhiro Sugawara
  • p. 47
  • 4.
  • Bias Dependence of NC-AFM Images and Tunneling Current Variations on Semiconductor Surfaces/
  • Toyoko Arai
  • Masahiko Tomitori
  • p. 79
  • p. 93
  • 5.
  • Alkali Halides/
  • Roland Bennewitz
  • Martin Bammerlin
  • Ernst Meyer
  • 6.
  • Atomic Resolution Imaging on Fluorides/
  • Michael Reichling
  • Clemens Barth
  • p. 109
  • Koichi Mukasa
  • p. 125
  • 7.
  • Atomically Resolved Imaging of a NiO(001) Surface/
  • Hirotaka Hosoi
  • Kazuhisa Sueoka
  • Kazunobu Hayakawa
  • 8.
  • Atomic Structure, Order and Disorder on High Temperature Reconstructed [alpha]-Al[subscript 2]O[subscript 3](0001)/
  • Clemens Barth
  • Michael Reichling
  • p. 135
  • 9.
  • NC-AFM Imaging of Surface Reconstructions and Metal Growth on Oxides/
  • Chi Lun Pang
  • Geoff Thornton
  • p. 147
  • 10.
  • Atoms and Molecules on TiO[subscript 2](110) and CeO[subscript 2](111) Surfaces/
  • Ken-ichi Fukui
  • Yasuhiro Iwasawa
  • p. 167
  • 11.
  • NC-AFM Imaging of Adsorbed Molecules/
  • Yasuhiro Sugawara
  • p. 183
  • 12.
  • Organic Molecular Films/
  • Hirofumi Yamada
  • p. 193
  • 13.
  • Single-Molecule Analysis/
  • Akira Sasahara
  • Hiroshi Onishi
  • p. 215
  • p. 233
  • 14.
  • Low-Temperature Measurements: Principles, Instrumentation, and Application/
  • Wolf Allers
  • Alexander Schwarz
  • Udo D. Schwarz
  • Katsunori Tagami
  • Satoshi Watanabe
  • p. 257
  • 15.
  • Theory of Non-Contact Atomic Force Microscopy/
  • Masaru Tsukada
  • Naruo Sasaki
  • Michel Gauthier
  • Ruben Perez
  • Ivan Stich
  • p. 279
  • 16.
  • Chemical Interaction in NC-AFM on Semiconductor Surfaces/
  • San-Huang Ke
  • Tsuyoshi Uda
  • Kiyoyuki Terakura
  • Michael Reichling
  • p. 305
  • 17.
  • Contrast Mechanisms on Insulating Surfaces/
  • Adam Foster
  • Alexander Shluger
  • Clemens Barth
  • 18.
  • Analysis of Microscopy and Spectroscopy Experiments/
  • Hendrik Holscher
  • p. 349
  • p. 371
  • 19.
  • Theory of Energy Dissipation into Surface Vibrations/
  • Michel Gauthier
  • Lev Kantorovich
  • Masaru Tsukada
  • 20.
  • Measurement of Dissipation Induced by Tip - Sample Interactions/
  • H. J. Hug
  • A. Baratoff
  • p. 395
  • Index.
  • p. 433
Control code
l82002021665
Dimensions
25 cm.
Extent
xviii, 439 p
Isbn
9783540431176
Lccn
2002021665
Media category
unmediated
Media MARC source
rdamedia
Media type code
  • n
Other physical details
ill

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      53.418074 -2.967913
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